Viscosity and elastic constants of thin films of amorphous Te alloys used for optical data storage

Journal of Applied Physics

Volumn 94, Issue 8, 2003, Pages 4908-4912

  Kalb, J ^a   Spaepen, F ^a   Leervad Pedersen, T P ^b   Wuttig, M ^b  

^a HARVARD UNIVERSITY   (United States)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; AMORPHOUS MATERIALS; MELTING; OPTICAL DATA STORAGE; SPUTTERING; STRESSES; TELLURIUM; THERMAL EXPANSION; VISCOSITY;

ELASTIC CONSTANTS;

THIN FILMS;

EID: 0242272436     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1610775     Document Type: Article

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