On the profile of frequency and voltage dependent interface states and series resistance in MIS structures

Physica B: Condensed Matter

Volumn 393, Issue 1-2, 2007, Pages 328-335

  Dökme, Ilbilge ^a   Altindal, Şemsettin ^a  

^a GAZI UNIVERSITY   (Turkey)

Author keywords

Electrical properties; Excess capacitance; Interface state density; MIS structure; Series resistance

Indexed keywords

CAPACITANCE; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTANCE; ELECTRIC FREQUENCY MEASUREMENT; ELECTRIC RESISTANCE; VALENCE BANDS;

INTERFACE STATE DENSITY; MIS STRUCTURES; SERIES RESISTANCE;

MIS DEVICES;

EID: 34047168923     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2007.01.020     Document Type: Article

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