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Volumn 17, Issue 1, 2007, Pages 154-162

Ti-Ni shape memory alloy film-actuated microstructures for a MEMS probe card

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT RESISTANCE; DEFORMATION; ELECTRODES; MEMS; MICROSTRUCTURE; SHAPE MEMORY EFFECT;

EID: 33947593586     PISSN: 09601317     EISSN: 13616439     Source Type: Journal    
DOI: 10.1088/0960-1317/17/1/020     Document Type: Article
Times cited : (19)

References (16)
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  • 2
    • 4444368874 scopus 로고    scopus 로고
    • Cantilever-type microelectromechanical systems probe card with through-wafer interconnects for fine pitch and high-speed testing
    • Kim B-H, Kim H-C, Chun K, Ki J and Tak Y 2004 Cantilever-type microelectromechanical systems probe card with through-wafer interconnects for fine pitch and high-speed testing Japan. J. Appl. Phys. 43 3877-81
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    • Kim, B.-H.1    Kim, H.-C.2    Chun, K.3    Ki, J.4    Tak, Y.5
  • 9
    • 33947596268 scopus 로고    scopus 로고
    • Joule's heat induced shape memory behavior of Ti-Ni shape memory alloy thin films
    • Inoue S, Namazu T, Hirayama A and Koterazawa K 2004 Joule's heat induced shape memory behavior of Ti-Ni shape memory alloy thin films Trans. Mater. Res. Soc. Japan 29 2985-8
    • (2004) Trans. Mater. Res. Soc. Japan , vol.29 , pp. 2985-2988
    • Inoue, S.1    Namazu, T.2    Hirayama, A.3    Koterazawa, K.4
  • 10
    • 0033345632 scopus 로고    scopus 로고
    • Martensitic transformation and shape memory behavior in sputter-deposited TiNi-base thin films
    • Miyazaki S and Ishida A 1999 Martensitic transformation and shape memory behavior in sputter-deposited TiNi-base thin films Mater. Sci. Eng. A 273-275 106-33
    • (1999) Mater. Sci. Eng. , vol.273-275 , pp. 106-133
    • Miyazaki, S.1    Ishida, A.2
  • 11
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    • Mechanical properties of Ti-Ni shape memory thin films formed by sputtering
    • Ishida A, Sato M and Miyazaki S 1999 Mechanical properties of Ti-Ni shape memory thin films formed by sputtering Mater. Sci. Eng. A 273-275 754-7
    • (1999) Mater. Sci. Eng. , vol.273-275 , pp. 754-757
    • Ishida, A.1    Sato, M.2    Miyazaki, S.3
  • 12
    • 25144462067 scopus 로고    scopus 로고
    • Shape memory thin films formed with carrousel-type magnetron sputtering apparatus
    • Ishida A, Sato M, Tabata O and Yoshikawa W 2005 Shape memory thin films formed with carrousel-type magnetron sputtering apparatus Smart Mater. Struct. 14 216-22
    • (2005) Smart Mater. Struct. , vol.14 , pp. 216-222
    • Ishida, A.1    Sato, M.2    Tabata, O.3    Yoshikawa, W.4
  • 14
    • 85009643373 scopus 로고    scopus 로고
    • Mechanical properties of polycrystalline titanium nitride films measured by XRD tensile testing
    • Namazu T, Inoue S, Takemoto H and Koterazawa K 2005 Mechanical properties of polycrystalline titanium nitride films measured by XRD tensile testing IEEJ Trans. Sensors Micromach. 125 374-9
    • (2005) IEEJ Trans. Sensors Micromach. , vol.125 , Issue.9 , pp. 374-379
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  • 15
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    • Thermomechanical behavior of Ti-Ni shape memory alloy films deposited by DC magnetron sputtering
    • Namazu T, Inoue S, Hashizume A and Koterazawa K 2006 Thermomechanical behavior of Ti-Ni shape memory alloy films deposited by DC magnetron sputtering Vacuum 80 726-31
    • (2006) Vacuum , vol.80 , Issue.7 , pp. 726-731
    • Namazu, T.1    Inoue, S.2    Hashizume, A.3    Koterazawa, K.4
  • 16
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    • Theory of piezoelectric axisymmetric bimorph
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.