메뉴 건너뛰기




Volumn 125, Issue 9, 2006, Pages 374-379

Mechanical Properties of Polycrystalline Titanium Nitride Films Measured by XRD Tensile Testing

Author keywords

fracture strength; lateral strain; Poisson's ratio; Tensile test; TiN film; X ray diffraction (XRD); Young's modulus

Indexed keywords


EID: 85009643373     PISSN: 13418939     EISSN: 13475525     Source Type: Journal    
DOI: 10.1541/ieejsmas.125.374     Document Type: Article
Times cited : (40)

References (13)
  • 1
    • 0032656645 scopus 로고    scopus 로고
    • An investigation into the performance of diffusion barrier materials against copper diffusion using metal-oxide-semiconductor (MOS) capacitor structures
    • V. S. C. Len,: “An investigation into the performance of diffusion barrier materials against copper diffusion using metal-oxide-semiconductor (MOS) capacitor structures”, Solid-State Electronics, Vol. 43, No. 6, pp.1045-1049 (1999)
    • (1999) Solid-State Electronics , vol.43
    • Len, V.S.C.1
  • 3
    • 0036743253 scopus 로고    scopus 로고
    • “Extracting hardness and Young's modulus from load-displacement curves”, Z. Metallkd
    • S. J. Bull: “Extracting hardness and Young's modulus from load-displacement curves”, Z. Metallkd., Vol. 93, No. 9, pp.870-874 (2002)
    • (2002) , vol.93
    • Bull, S.J.1
  • 4
    • 0031631011 scopus 로고    scopus 로고
    • Mechanical properties of TiN thin films investigated using biaxial tensile testing
    • O. R. Shojaei,: “Mechanical properties of TiN thin films investigated using biaxial tensile testing”, Surf. Eng., Vol. 14, No. 3, pp.240-245 (1998)
    • (1998) Surf. Eng. , vol.14
    • Shojaei, O.R.1
  • 5
    • 0031236953 scopus 로고    scopus 로고
    • A new technique for measuring the mechanical properties of thin films
    • W. N. Sharpe, Jr.: “A new technique for measuring the mechanical properties of thin films”, J. Microelectromech. Syst., Vol. 6, No. 3, pp.193-199 (1997)
    • (1997) J. Microelectromech. Syst. , vol.6
    • Sharpe, W.N.1
  • 6
    • 0036118065 scopus 로고    scopus 로고
    • Mechanical characterization of sub-micrometer thick DLC films by AFM tensile testing for surface modification in MEMS
    • Y. Isono,: “Mechanical characterization of sub-micrometer thick DLC films by AFM tensile testing for surface modification in MEMS”, Proc. The Fifteenth IEEE Int. Conf on Microelectromech. Syst., pp.431-434 (2002)
    • (2002) Proc. The Fifteenth IEEE Int. Conf on Microelectromech. Syst. , pp. 431-434
    • Isono, Y.1
  • 7
    • 0031118043 scopus 로고    scopus 로고
    • Tensile testing as a method for determining the Young's modulus of thin hard coatings
    • P. Hollman,: “Tensile testing as a method for determining the Young's modulus of thin hard coatings”, Surface and Coating Technology, Vol. 90, pp.234-238 (1997)
    • (1997) Surface and Coating Technology , vol.90
    • Hollman, P.1
  • 8
    • 3042700007 scopus 로고    scopus 로고
    • Direct measurement technique of strain in XRD tensile test for evaluating Poisson's ratio of micron-thick TiN films
    • T. Namazu,: “Direct measurement technique of strain in XRD tensile test for evaluating Poisson's ratio of micron-thick TiN films”, Proc. The Seventeenth IEEE Int. Conf. on Microelectromech. Syst., pp.157-160 (2004)
    • (2004) Proc. The Seventeenth IEEE Int. Conf. on Microelectromech. Syst. , pp. 157-160
    • Namazu, T.1
  • 9
    • 0032671886 scopus 로고    scopus 로고
    • Effect of partial pressure on the internal stress and the crystallographic structure of r.f reactive sputtered Ti-N films
    • S. Inoue,: “Effect of partial pressure on the internal stress and the crystallographic structure of r.f reactive sputtered Ti-N films”. Thin Solid Films, Vol.343-344, pp.230-233 (1999)
    • (1999) Thin Solid Films , vol.343 , Issue.344 , pp. 230-233
    • Inoue, S.1
  • 10
    • 85009602551 scopus 로고    scopus 로고
    • Composite Materials, Science and Engineering
    • New York
    • K. K. Chawla: Composite Materials, Science and Engineering, New York: Springer-Verlag, pp.207-213 (1998)
    • (1998) Springer-Verlag , pp. 207-213
    • Chawla, K.K.1
  • 11
    • 34249014932 scopus 로고
    • “Measurement of elastic constants at low temperatures by means of ultrasonic waves data for silicon and germanium single crystals, and for fused silica”, J. Appl Phys
    • H. J. McSkimin: “Measurement of elastic constants at low temperatures by means of ultrasonic waves data for silicon and germanium single crystals, and for fused silica”, J. Appl Phys., Vol. 24, No. 8, pp.988-997 (1953)
    • (1953) , vol.24
    • McSkimin, H.J.1
  • 12
    • 0034468211 scopus 로고    scopus 로고
    • Evaluation of size effect on mechanical properties of single crystal silicon by nanoscale bending test using AFM
    • T. Namazu,: “Evaluation of size effect on mechanical properties of single crystal silicon by nanoscale bending test using AFM”, J. Microelectromech. Syst., Vol. 9, No. 4, pp.450-459 (2000)
    • (2000) J. Microelectromech. Syst. , vol.9
    • Namazu, T.1
  • 13
    • 0026875935 scopus 로고
    • “An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments”, J. Mater Res
    • W. C. Oliver,: “An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments”, J. Mater Res., Vol. 7, No. 6, pp.1564-1583 (1992)
    • (1992) , vol.7
    • Oliver, W.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.