-
1
-
-
0030106421
-
Effect of solid-state intermetallic growth on the fracture toughness of Cu/63Sn-37Pb solder joints
-
Mar
-
R. E. Pratt, E. I. Stromswold, and D. J. Quesnel, "Effect of solid-state intermetallic growth on the fracture toughness of Cu/63Sn-37Pb solder joints," IEEE Trans. Comp., Packag., Manufact. Technol. A, vol. 19, no. 1, pp. 134-141, Mar. 1996.
-
(1996)
IEEE Trans. Comp., Packag., Manufact. Technol. A
, vol.19
, Issue.1
, pp. 134-141
-
-
Pratt, R.E.1
Stromswold, E.I.2
Quesnel, D.J.3
-
2
-
-
0141886890
-
Effect of reaction time and P content on mechanical strength of the interface formed between eutectic Sn-Ag solder and Au/electroless Ni(P)/Cu bond pad
-
Sep
-
M. O. Alam, Y. C. Chan, and K. N. Tu, "Effect of reaction time and P content on mechanical strength of the interface formed between eutectic Sn-Ag solder and Au/electroless Ni(P)/Cu bond pad," J. Appl. Phys., vol. 94, no. 6, pp. 4108-4115, Sep. 2003.
-
(2003)
J. Appl. Phys
, vol.94
, Issue.6
, pp. 4108-4115
-
-
Alam, M.O.1
Chan, Y.C.2
Tu, K.N.3
-
3
-
-
13944270988
-
Mechanical strength of thermally aged Sn-3.5Ag/Ni-P solder joints
-
Jan
-
M. He, Z. Chen, and G. J. Qi, "Mechanical strength of thermally aged Sn-3.5Ag/Ni-P solder joints," Metall. Mater. Trans. A, vol. 36, pp. 65-75, Jan. 2005.
-
(2005)
Metall. Mater. Trans. A
, vol.36
, pp. 65-75
-
-
He, M.1
Chen, Z.2
Qi, G.J.3
-
4
-
-
0035797072
-
Tin-lead (SnPb) solder reaction in flip chip technology
-
Jul
-
K. N. Tu and K. Zeng, 'Tin-lead (SnPb) solder reaction in flip chip technology," Mater. Sci. Eng. R, vol. 34, pp. 1-58, Jul. 2001.
-
(2001)
Mater. Sci. Eng. R
, vol.34
, pp. 1-58
-
-
Tu, K.N.1
Zeng, K.2
-
5
-
-
0007879455
-
Electroless Plating: Fundamental and Applications. Orlando, FL: Amer
-
Finishes Soc
-
G. O. Mallory and J. B. Hajdu, Electroless Plating: Fundamental and Applications. Orlando, FL: Amer. Electroplaters Surf. Finishes Soc., 1990, pp. 111-113.
-
(1990)
Electroplaters Surf
, pp. 111-113
-
-
Mallory, G.O.1
Hajdu, J.B.2
-
6
-
-
0028494896
-
The interaction kinetics and compound formation between electroless Ni-P and solder
-
C. Y. Lee and K. L. Lin, "The interaction kinetics and compound formation between electroless Ni-P and solder," Thin Solid Films, vol. 249, pp. 201-206, 1994.
-
(1994)
Thin Solid Films
, vol.249
, pp. 201-206
-
-
Lee, C.Y.1
Lin, K.L.2
-
7
-
-
0032614004
-
Solder reaction-assisted crystallization of electroless Ni-P under bump metallization in low cost flip chip technology
-
Jun
-
J. W. Jang, P. G. Kim, K. N. Tu, D. R. Frear, and P. Thompson, "Solder reaction-assisted crystallization of electroless Ni-P under bump metallization in low cost flip chip technology," J. Appl. Phys., vol. 85, no. 12, pp. 8456-8463. Jun. 1999.
-
(1999)
J. Appl. Phys
, vol.85
, Issue.12
, pp. 8456-8463
-
-
Jang, J.W.1
Kim, P.G.2
Tu, K.N.3
Frear, D.R.4
Thompson, P.5
-
8
-
-
0034314672
-
Thermal stability of electroless-nickel/solder interface: Part A. Interfacial chemistry and microstructure
-
Nov
-
P. L. Liu, Z. Xu, and J. K. Shang, "Thermal stability of electroless-nickel/solder interface: Part A. Interfacial chemistry and microstructure," Metall. Mater. Trans. A, vol. 31, pp. 2857-2866, Nov. 2000.
-
(2000)
Metall. Mater. Trans. A
, vol.31
, pp. 2857-2866
-
-
Liu, P.L.1
Xu, Z.2
Shang, J.K.3
-
9
-
-
0036613819
-
TEM observation of interfaces in a solder joint in a semiconductor device
-
H. Matsuki, H. Ibuka, and H. Saka, 'TEM observation of interfaces in a solder joint in a semiconductor device," Sci. Technol. Adv. Mater., vol. 3, pp. 261-270, 2002.
-
(2002)
Sci. Technol. Adv. Mater
, vol.3
, pp. 261-270
-
-
Matsuki, H.1
Ibuka, H.2
Saka, H.3
-
10
-
-
0038688838
-
Comparison of interfacial reactions and reliabilities of Sn3.5Ag, Sn4.OAgO.5Cu, and Sn0.7Cu solder bumps on electroless Ni-P UBMs
-
Y. D. Jeon, A. Ostmann, H. Reichl, and K. W. Paik, "Comparison of interfacial reactions and reliabilities of Sn3.5Ag, Sn4.OAgO.5Cu, and Sn0.7Cu solder bumps on electroless Ni-P UBMs," in Proc. IEEE Electron. Comp. Technol. Conf., 2003, pp. 1203-1208.
-
(2003)
Proc. IEEE Electron. Comp. Technol. Conf
, pp. 1203-1208
-
-
Jeon, Y.D.1
Ostmann, A.2
Reichl, H.3
Paik, K.W.4
-
11
-
-
0042530329
-
3P crystalline layer in Ni(P) substrate by reacting with Cu-bearing Sn(Cu) solders
-
3P crystalline layer in Ni(P) substrate by reacting with Cu-bearing Sn(Cu) solders," Scripta Mater., vol. 49, pp. 813-818, 2003.
-
(2003)
Scripta Mater
, vol.49
, pp. 813-818
-
-
Wang, S.J.1
Liu, C.Y.2
-
12
-
-
1842554859
-
Solid state interfacial reaction of Sn-37Pb and Sn-3.5Ag solder with Ni-P under bump metallization
-
M. He, Z. Chen, and G. Qi, "Solid state interfacial reaction of Sn-37Pb and Sn-3.5Ag solder with Ni-P under bump metallization," Acta Mater., vol. 52, pp. 2047-2056, 2004.
-
(2004)
Acta Mater
, vol.52
, pp. 2047-2056
-
-
He, M.1
Chen, Z.2
Qi, G.3
-
13
-
-
20744444741
-
Barrier properties of thin Au/Ni-P under bump metallization for Sn-3.5Ag solder
-
A. Kumar, M. He, and Z. Chen, "Barrier properties of thin Au/Ni-P under bump metallization for Sn-3.5Ag solder," Surf. Coat. Technol., vol. 198, pp. 283-286, 2005.
-
(2005)
Surf. Coat. Technol
, vol.198
, pp. 283-286
-
-
Kumar, A.1
He, M.2
Chen, Z.3
-
14
-
-
33644922029
-
Effect of Ni-P thickness on solid-state interfacial reactions between Sn-3.5Ag solder and electroless Ni-P metallization on Cu substrate
-
A. Kumar, Z. Chen, S. Mhaisalkar, C. C. Wong, P. S. Teo, and V. Kripesh, "Effect of Ni-P thickness on solid-state interfacial reactions between Sn-3.5Ag solder and electroless Ni-P metallization on Cu substrate," Thin Solid Films, vol. 504, pp. 410-415, 2006.
-
(2006)
Thin Solid Films
, vol.504
, pp. 410-415
-
-
Kumar, A.1
Chen, Z.2
Mhaisalkar, S.3
Wong, C.C.4
Teo, P.S.5
Kripesh, V.6
-
15
-
-
0031625840
-
Brittle interfacial fracture of PBGA packages soldered on electroless nickel/immersion gold
-
Z. Mei, M. Kaufmann, A. Eslambolchi, and.P. Johnson, "Brittle interfacial fracture of PBGA packages soldered on electroless nickel/immersion gold," in Proc. IEEE Electron. Comp. Technol. Conf., 1998, pp. 952-961.
-
(1998)
Proc. IEEE Electron. Comp. Technol. Conf
, pp. 952-961
-
-
Mei, Z.1
Kaufmann, M.2
Eslambolchi, A.3
Johnson, P.4
-
16
-
-
0034273725
-
Effect of aging on the microstructure and shear strength of SnPbAg/Ni-P/Cu and SnAg/Ni-P/Cu solder joints
-
S. Ahat, L. Du, M. Sheng, L. Luo, W. Kempe, and J. Freytag, "Effect of aging on the microstructure and shear strength of SnPbAg/Ni-P/Cu and SnAg/Ni-P/Cu solder joints," J. Electron. Mater., vol. 29, no. 9, pp. 1105-1109, 2000.
-
(2000)
J. Electron. Mater
, vol.29
, Issue.9
, pp. 1105-1109
-
-
Ahat, S.1
Du, L.2
Sheng, M.3
Luo, L.4
Kempe, W.5
Freytag, J.6
-
17
-
-
85083081135
-
Thermal stability of electroless-nickel/ solder interface: Part A. Interfacial fatigue resistance
-
Nov
-
P. L. Liu and J. K. Shang, "Thermal stability of electroless-nickel/ solder interface: Part A. Interfacial fatigue resistance," Metall. Mater. Trans. A, vol. 31, pp. 2867-2875, Nov. 2000.
-
(2000)
Metall. Mater. Trans. A
, vol.31
, pp. 2867-2875
-
-
Liu, P.L.1
Shang, J.K.2
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