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Volumn 29, Issue 4, 2006, Pages 886-891

Effect of Ni-P thickness on the tensile strength of Cu/electroless Ni-P/Sn-3.5Ag solder joint

Author keywords

Electroless nickel; Interfacial reaction; Metallization; Reliability; Solder; Tensile strength

Indexed keywords

AGING OF MATERIALS; BRITTLE FRACTURE; COPPER; ELECTROLESS PLATING; INTERMETALLICS; METALLIZING; RELIABILITY; SURFACE CHEMISTRY; TENSILE STRENGTH;

EID: 33947257921     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAPT.2006.886847     Document Type: Article
Times cited : (7)

References (17)
  • 1
    • 0030106421 scopus 로고    scopus 로고
    • Effect of solid-state intermetallic growth on the fracture toughness of Cu/63Sn-37Pb solder joints
    • Mar
    • R. E. Pratt, E. I. Stromswold, and D. J. Quesnel, "Effect of solid-state intermetallic growth on the fracture toughness of Cu/63Sn-37Pb solder joints," IEEE Trans. Comp., Packag., Manufact. Technol. A, vol. 19, no. 1, pp. 134-141, Mar. 1996.
    • (1996) IEEE Trans. Comp., Packag., Manufact. Technol. A , vol.19 , Issue.1 , pp. 134-141
    • Pratt, R.E.1    Stromswold, E.I.2    Quesnel, D.J.3
  • 2
    • 0141886890 scopus 로고    scopus 로고
    • Effect of reaction time and P content on mechanical strength of the interface formed between eutectic Sn-Ag solder and Au/electroless Ni(P)/Cu bond pad
    • Sep
    • M. O. Alam, Y. C. Chan, and K. N. Tu, "Effect of reaction time and P content on mechanical strength of the interface formed between eutectic Sn-Ag solder and Au/electroless Ni(P)/Cu bond pad," J. Appl. Phys., vol. 94, no. 6, pp. 4108-4115, Sep. 2003.
    • (2003) J. Appl. Phys , vol.94 , Issue.6 , pp. 4108-4115
    • Alam, M.O.1    Chan, Y.C.2    Tu, K.N.3
  • 3
    • 13944270988 scopus 로고    scopus 로고
    • Mechanical strength of thermally aged Sn-3.5Ag/Ni-P solder joints
    • Jan
    • M. He, Z. Chen, and G. J. Qi, "Mechanical strength of thermally aged Sn-3.5Ag/Ni-P solder joints," Metall. Mater. Trans. A, vol. 36, pp. 65-75, Jan. 2005.
    • (2005) Metall. Mater. Trans. A , vol.36 , pp. 65-75
    • He, M.1    Chen, Z.2    Qi, G.J.3
  • 4
    • 0035797072 scopus 로고    scopus 로고
    • Tin-lead (SnPb) solder reaction in flip chip technology
    • Jul
    • K. N. Tu and K. Zeng, 'Tin-lead (SnPb) solder reaction in flip chip technology," Mater. Sci. Eng. R, vol. 34, pp. 1-58, Jul. 2001.
    • (2001) Mater. Sci. Eng. R , vol.34 , pp. 1-58
    • Tu, K.N.1    Zeng, K.2
  • 5
    • 0007879455 scopus 로고
    • Electroless Plating: Fundamental and Applications. Orlando, FL: Amer
    • Finishes Soc
    • G. O. Mallory and J. B. Hajdu, Electroless Plating: Fundamental and Applications. Orlando, FL: Amer. Electroplaters Surf. Finishes Soc., 1990, pp. 111-113.
    • (1990) Electroplaters Surf , pp. 111-113
    • Mallory, G.O.1    Hajdu, J.B.2
  • 6
    • 0028494896 scopus 로고
    • The interaction kinetics and compound formation between electroless Ni-P and solder
    • C. Y. Lee and K. L. Lin, "The interaction kinetics and compound formation between electroless Ni-P and solder," Thin Solid Films, vol. 249, pp. 201-206, 1994.
    • (1994) Thin Solid Films , vol.249 , pp. 201-206
    • Lee, C.Y.1    Lin, K.L.2
  • 7
    • 0032614004 scopus 로고    scopus 로고
    • Solder reaction-assisted crystallization of electroless Ni-P under bump metallization in low cost flip chip technology
    • Jun
    • J. W. Jang, P. G. Kim, K. N. Tu, D. R. Frear, and P. Thompson, "Solder reaction-assisted crystallization of electroless Ni-P under bump metallization in low cost flip chip technology," J. Appl. Phys., vol. 85, no. 12, pp. 8456-8463. Jun. 1999.
    • (1999) J. Appl. Phys , vol.85 , Issue.12 , pp. 8456-8463
    • Jang, J.W.1    Kim, P.G.2    Tu, K.N.3    Frear, D.R.4    Thompson, P.5
  • 8
    • 0034314672 scopus 로고    scopus 로고
    • Thermal stability of electroless-nickel/solder interface: Part A. Interfacial chemistry and microstructure
    • Nov
    • P. L. Liu, Z. Xu, and J. K. Shang, "Thermal stability of electroless-nickel/solder interface: Part A. Interfacial chemistry and microstructure," Metall. Mater. Trans. A, vol. 31, pp. 2857-2866, Nov. 2000.
    • (2000) Metall. Mater. Trans. A , vol.31 , pp. 2857-2866
    • Liu, P.L.1    Xu, Z.2    Shang, J.K.3
  • 9
    • 0036613819 scopus 로고    scopus 로고
    • TEM observation of interfaces in a solder joint in a semiconductor device
    • H. Matsuki, H. Ibuka, and H. Saka, 'TEM observation of interfaces in a solder joint in a semiconductor device," Sci. Technol. Adv. Mater., vol. 3, pp. 261-270, 2002.
    • (2002) Sci. Technol. Adv. Mater , vol.3 , pp. 261-270
    • Matsuki, H.1    Ibuka, H.2    Saka, H.3
  • 10
    • 0038688838 scopus 로고    scopus 로고
    • Comparison of interfacial reactions and reliabilities of Sn3.5Ag, Sn4.OAgO.5Cu, and Sn0.7Cu solder bumps on electroless Ni-P UBMs
    • Y. D. Jeon, A. Ostmann, H. Reichl, and K. W. Paik, "Comparison of interfacial reactions and reliabilities of Sn3.5Ag, Sn4.OAgO.5Cu, and Sn0.7Cu solder bumps on electroless Ni-P UBMs," in Proc. IEEE Electron. Comp. Technol. Conf., 2003, pp. 1203-1208.
    • (2003) Proc. IEEE Electron. Comp. Technol. Conf , pp. 1203-1208
    • Jeon, Y.D.1    Ostmann, A.2    Reichl, H.3    Paik, K.W.4
  • 11
    • 0042530329 scopus 로고    scopus 로고
    • 3P crystalline layer in Ni(P) substrate by reacting with Cu-bearing Sn(Cu) solders
    • 3P crystalline layer in Ni(P) substrate by reacting with Cu-bearing Sn(Cu) solders," Scripta Mater., vol. 49, pp. 813-818, 2003.
    • (2003) Scripta Mater , vol.49 , pp. 813-818
    • Wang, S.J.1    Liu, C.Y.2
  • 12
    • 1842554859 scopus 로고    scopus 로고
    • Solid state interfacial reaction of Sn-37Pb and Sn-3.5Ag solder with Ni-P under bump metallization
    • M. He, Z. Chen, and G. Qi, "Solid state interfacial reaction of Sn-37Pb and Sn-3.5Ag solder with Ni-P under bump metallization," Acta Mater., vol. 52, pp. 2047-2056, 2004.
    • (2004) Acta Mater , vol.52 , pp. 2047-2056
    • He, M.1    Chen, Z.2    Qi, G.3
  • 13
    • 20744444741 scopus 로고    scopus 로고
    • Barrier properties of thin Au/Ni-P under bump metallization for Sn-3.5Ag solder
    • A. Kumar, M. He, and Z. Chen, "Barrier properties of thin Au/Ni-P under bump metallization for Sn-3.5Ag solder," Surf. Coat. Technol., vol. 198, pp. 283-286, 2005.
    • (2005) Surf. Coat. Technol , vol.198 , pp. 283-286
    • Kumar, A.1    He, M.2    Chen, Z.3
  • 14
    • 33644922029 scopus 로고    scopus 로고
    • Effect of Ni-P thickness on solid-state interfacial reactions between Sn-3.5Ag solder and electroless Ni-P metallization on Cu substrate
    • A. Kumar, Z. Chen, S. Mhaisalkar, C. C. Wong, P. S. Teo, and V. Kripesh, "Effect of Ni-P thickness on solid-state interfacial reactions between Sn-3.5Ag solder and electroless Ni-P metallization on Cu substrate," Thin Solid Films, vol. 504, pp. 410-415, 2006.
    • (2006) Thin Solid Films , vol.504 , pp. 410-415
    • Kumar, A.1    Chen, Z.2    Mhaisalkar, S.3    Wong, C.C.4    Teo, P.S.5    Kripesh, V.6
  • 15
  • 16
    • 0034273725 scopus 로고    scopus 로고
    • Effect of aging on the microstructure and shear strength of SnPbAg/Ni-P/Cu and SnAg/Ni-P/Cu solder joints
    • S. Ahat, L. Du, M. Sheng, L. Luo, W. Kempe, and J. Freytag, "Effect of aging on the microstructure and shear strength of SnPbAg/Ni-P/Cu and SnAg/Ni-P/Cu solder joints," J. Electron. Mater., vol. 29, no. 9, pp. 1105-1109, 2000.
    • (2000) J. Electron. Mater , vol.29 , Issue.9 , pp. 1105-1109
    • Ahat, S.1    Du, L.2    Sheng, M.3    Luo, L.4    Kempe, W.5    Freytag, J.6
  • 17
    • 85083081135 scopus 로고    scopus 로고
    • Thermal stability of electroless-nickel/ solder interface: Part A. Interfacial fatigue resistance
    • Nov
    • P. L. Liu and J. K. Shang, "Thermal stability of electroless-nickel/ solder interface: Part A. Interfacial fatigue resistance," Metall. Mater. Trans. A, vol. 31, pp. 2867-2875, Nov. 2000.
    • (2000) Metall. Mater. Trans. A , vol.31 , pp. 2867-2875
    • Liu, P.L.1    Shang, J.K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.