Interfacial structure, bonding and composition of InAs and GaSb thin films determined using coherent Bragg rod analysis

Physical Review B - Condensed Matter and Materials Physics

Volumn 75, Issue 11, 2007, Pages

  Cionca, C N ^a   Walko, D A ^b   Yacoby, Y ^c   Dorin, C ^a,d   Mirecki Millunchick, J ^a   Clarke, R ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^d INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33847772770     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.115306     Document Type: Article

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