Circuits and techniques for high-resolution measurement of on-chip power supply noise

IEEE Journal of Solid-State Circuits

Volumn 40, Issue 4, 2005, Pages 820-827

  Alon, Elad ^a,b   Stojanović, Vladimir ^a,b,c   Horowitz, Mark A ^a,b  

^a Stanford University   (United States)

^b RAMBUS INC   (United States)

^c USA   (United States)

Author keywords

Analog digital conversion; Power delivery validation; Random noise; Spectral measurement; Supply noise measurement

Indexed keywords

ANALOG TO DIGITAL CONVERSION; ELECTRIC IMPEDANCE; MICROPROCESSOR CHIPS; NETWORKS (CIRCUITS); POWER SUPPLY CIRCUITS; VARIABLE FREQUENCY OSCILLATORS; WAVEFORM ANALYSIS;

POWER DELIVERY VALIDATION; RANDOM NOISE; SPECTRAL MEASUREMENTS; SUPPLY NOISE MEASUREMENTS;

SPURIOUS SIGNAL NOISE;

EID: 18744370810     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2004.842853     Document Type: Conference Paper

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