Critical analysis of short-term negative bias temperature instability measurements: Explaining the effect of time-zero delay for on-the-fly measurements

Applied Physics Letters

Volumn 90, Issue 8, 2007, Pages

  Islam, Ahmad Ehteshamul ^a   Kufluoglu, Haldun ^a   Varghese, Dhanoop ^a   Alam, Muhammad Ashraful ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NEGATIVE BIAS TEMPERATURE INSTABILITY (NBTI); REACTION DIFFUSION (R-D) MODEL; STRESS DATA;

DEGRADATION; DIFFUSION; MATHEMATICAL MODELS; THERMAL STRESS;

TEMPERATURE MEASUREMENT;

EID: 33847240065     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2695998     Document Type: Article

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