Probing particle structure in waterborne pressure-sensitive adhesives with atomic force microscopy

Journal of Colloid and Interface Science

Volumn 307, Issue 1, 2007, Pages 56-63

  Lei, C H ^a   Ouzineb, K ^b   Dupont, O ^b   Keddie, J L ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b Cytec Specialty Chemicals Belgium   (Belgium)

Author keywords

Adhesive; Atomic force microscopy; Film formation; Height artefacts; Indentation; Latex; Nanostructure; Surfactant

Indexed keywords

ACRYLICS; ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; INDENTATION; LATEXES; POLYMERS; PRESSURE EFFECTS; SURFACE ACTIVE AGENTS;

FILM FORMATION; HEIGHT ARTEFACTS; PRESSURE-SENSITIVE ADHESIVE (PSA); TAPPING FORCE;

ADHESIVES;

ADHESIVE AGENT; POLYMER;

ALGOMETRY; ARTICLE; ARTIFACT; ATOMIC FORCE MICROSCOPY; COLLOID; CORRELATION ANALYSIS; FILM; PARTICLE SIZE; PRESSURE MEASUREMENT; PRIORITY JOURNAL; ROOM TEMPERATURE; SENSITIVITY ANALYSIS; SOLID; VISCOELASTICITY;

EID: 33847067900     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2006.11.036     Document Type: Article

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