Investigation of the radial deformability of individual carbon nanotubes under controlled indentation force

Physical Review Letters

Volumn 85, Issue 7, 2000, Pages 1456-1459

  Yu, Min Feng ^a   Kowalewski, Tomasz ^a,b   Ruoff, Rodney S ^a,c  

^a WASHINGTON UNIVERSITY   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

^c Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AIR; ATOMIC FORCE MICROSCOPY; BUTANE; CARBON; ELECTRON BEAM LITHOGRAPHY; OXIDATION; PLASMA ETCHING; SILICON WAFERS; SURFACE TOPOGRAPHY; SYNTHESIS (CHEMICAL);

ARC DISCHARGE METHOD; CARBON NANOTUBE; CONTROLLED INDENTION FORCE; MULTIWALLED CARBON NANOTUBE; RADIAL DEFORMABILITY;

NANOTUBES;

EID: 0034250195     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.1456     Document Type: Article

References (24)

1. A. Krishnan et al., Phys. Rev. B 58, 14 031 (1998).
2. P. Poncharal et al., Science 283, 1513 (1999).
3. J.-P. Salvetat et al., Phys. Rev. Lett. 82, 944 (1999).
4. M.-F. Yu et al., Science 287, 637 (2000).
5. M. R. Falvo et al., Nature (London) 389, 582 (1997).
6. B. I. Yakobson, in Proceedings of the Symposium on Fullerenes, Electrochemical Society, edited by R. S. Ruoff and K. M. Kadish (ECS, Pennington, 1997), p. 549.
7. M. Buongiorno Nardelli, B. I. Yakobson, and J. Bernholc, Phys. Rev. B 57, R4277 (1998).
8. R. S. Ruoff et al., Nature (London) 364, 514 (1993).
9. J. Tersoff and R. S. Ruoff, Phys. Rev. Lett. 73, 676 (1994).
10. N. G. Chopra et al., Nature (London) 377, 135 (1995).
11. V. Lordi and N. Yao, J. Chem. Phys. 109, 2509 (1998).
12. R. Martel et al., Appl. Phys. Lett. 73, 2447 (1998).
13. C.-J. Park, Y-H. Kim, and K. J. Chang, Phys. Rev. B 60, 10 656 (1999).
14. P. E. Lammert, P. Zhang, and V. H. Crespi, Phys. Rev. Lett. 84, 2453 (2000).
15. Q. Zhong et al., Surf. Sci. Lett. 290, L688 (1993).
16. J. H. Hafner, Nanotube tips for AFM, at http://www. cnst.rice.edu/mount.html on the Internet. We appreciate receiving this sample from the Smalley group at Rice University.
17. We acknowledge the use of the Cornell Nanofabrication Facility where electron beam lithography and plasma etching were used to pattern trenches.
18. R. Garcia and A. S. Paulo, Phys. Rev. B 60, 4961 (1999).
19. S. C. Fain, Jr. et al., Appl. Phys. Lett. 76, 930 (2000).
20. T. Kowalewski (to be published).
21. T. W. Ebbesen, Carbon Nanotubes: Preparation and Properties (CPC Press, New York, 1997).
22. C. T. Gibson, G. S. Watson, and S. Myhra, Scanning 19, 564 (1997).
23. A. P. Boresi and O. M. Sidebottom, Advanced Mechanics of Materials (John Wiley & Sons, New York, 1985).
24. H. G. Elias, An Introduction to Polymer Science (VCN Publishers, New York, 1997).