Morphological and micro-Raman investigations on Ar + -ion irradiated nanostructured GaAs surface

Applied Surface Science

Volumn 253, Issue 10, 2007, Pages 4531-4536

  Mohanta, S K ^a   Soni, R K ^a   Gosvami, N ^b   Tripathy, S ^b   Kanjilal, D ^c  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

^b INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

^c INTER UNIVERSITY ACCELERATOR CENTRE   (India)

Author keywords

GaAs; Low energy ion irradiation; Nanostructuring; Raman scattering; Rapid thermal annealing

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON ENERGY LEVELS; IONS; PHONONS; RAMAN SCATTERING; SEMICONDUCTING GALLIUM ARSENIDE;

ION DOSE; LOW ENERGY ION IRRADIATION; MICRO-RAMAN SCATTERING; NANOSTRUCTURING;

NANOSTRUCTURED MATERIALS;

EID: 33847016065     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.10.020     Document Type: Article

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