Capacitance measurements on small parallel plate capacitors using nanoscale impedance microscopy

Applied Physics Letters

Volumn 90, Issue 4, 2007, Pages

  Schneegans, Olivier ^a   Chrétien, Pascal ^a   Houzé, Frédéric ^a   Meyer, René ^a  

^a UNIV PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; COMPUTER SIMULATION; ELECTRIC IMPEDANCE; ELECTRODES; MATHEMATICAL MODELS; NANOTECHNOLOGY;

NANOSCALE IMPEDANCE MICROSCOPY (NIM); RECTANGULAR ELECTRODES; SQUARE PARALLEL PLATE CAPACITORS;

CAPACITANCE MEASUREMENT;

EID: 33846641291     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2437052     Document Type: Article

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