Nanometric cartography of tunnel current in metal-oxide junctions

Journal of Applied Physics

Volumn 83, Issue 11, 1998, Pages 6703-6705

  Da Costa, V ^a   Bardou, F ^a   Beal C ^a   Henry, Y ^a   Bucher, J P ^a   Ounadjela, K ^a  

^a INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000093211     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367814     Document Type: Article

References (14)

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14. 3σ2/(2λ2).