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Volumn 35, Issue 12, 2006, Pages 2142-2146

Thickness determination of ultrathin oxide films and its application in magnetic tunnel junctions

Author keywords

Magnetic tunnel junction; Oxide; X ray photoelectron spectroscopy (XPS)

Indexed keywords

MAGNETIC TUNNEL JUNCTION; MAGNETORESISTANCE RATIO; TUNNEL BARRIER MATERIALS;

EID: 33846411831     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-006-0324-5     Document Type: Conference Paper
Times cited : (2)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.