Recent Developments in Magnetic Tunnel Junctions

IEEE Transactions on Magnetics

Volumn 39, Issue 5 II, 2003, Pages 2770-2775

  Xiang, X H ^a   Zhu, T ^b   Sheng, F ^b   Zhang, Z ^b   Xiao, John Q ^a  

^a UNIVERSITY OF DELAWARE   (United States)

^b INSTITUTE OF PHYSICS   (China)

Author keywords

Electron holography; Magnetic tunneling junction (MTJ); Tunneling magnetoresistance (TMR) bias dependence

Indexed keywords

ELECTRON HOLOGRAPHY; INTERFACES (MATERIALS); MAGNETORESISTANCE; SECONDARY ION MASS SPECTROMETRY; STRUCTURE (COMPOSITION); TRANSMISSION ELECTRON MICROSCOPY;

ELEMENTAL MAPPING;

TUNNEL JUNCTIONS;

EID: 0141884209     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2003.815705     Document Type: Article

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