Resonant Auger studies of metallic systems

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 18, Issue 4 II, 2000, Pages 1955-1958

  Coulthard, I ^a   Antel Jr , W J ^a   Frigo, S P ^a   Freeland, J W ^a   Moore, J ^a   Calaway, W S ^a   Pellin, M J ^a   Mendelsohn, M ^a   Sham, T K ^b   Naftel, S J ^b   Stampfl, A P J ^a,c  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF WESTERN ONTARIO   (Canada)

^c Physics Division   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; AUGER ELECTRON SPECTROSCOPY; COBALT; COPPER;

RESONANT AUGER SPECTROSCOPY;

ELECTRONIC STRUCTURE;

EID: 0034225886     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.582453     Document Type: Article

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25. Estimated from the universal electron escape depth curve assuming that the primary source of TEY signal is from secondary electrons of a few electron volts in kinetic energy.