Determination of the thickness of Al oxide films used as barriers in magnetic tunneling junctions

Applied Physics Letters

Volumn 78, Issue 20, 2001, Pages 3103-3105

  Zhu, W ^a   Hirschmugl, C J ^b   Laine, A D ^a   Sinkovic, B ^a   Parkin, S S P ^c  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

^c IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035858342     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1372619     Document Type: Article

References (11)

1. J. S. Moodera, J. Nowak, and R. J. M. van de Veerdonk, Phys. Rev. Lett. 80, 2941 (1998).
2. W. J. Gallagher, S. S. P. Parkin, Yu Lu, X. P. Bian, A. Marley, K. P. Roche, R. A. Altman, S. A. Rishton, C. Jahnes, T. M. Shaw, and Gang Xiao, J. Appl. Phys. 81, 3741 (1997).
3. S. Gider, B.-U. Runge, A. C. Marley, and S. S. P. Parkin, Science 281, 797 (1998).
4. C. T. Tanaka, J. Nowak, and J. S. Moodera, J. Appl. Phys. 81, 5515 (1997).
5. E. Yu. Tsymbal and D. G. Pettifor, Phys. Rev. B 58, 432 (1998).
6. C. H. Shang, J. Nowak, R. Jansen, and J. S. Moodera, Phys. Rev. B 58, R2917 (1998).
7. J. J. Sun and P. P. Freitas, J. Appl. Phys. 85, 5264 (1999).
8. J. S. Moodera, L. R. Kinder, T. M. Wong, and R. Meservey, Phys. Rev. Lett. 74, 3273 (1995).
9. Z. Katz-Tsameret and A. Raveh, J. Vac. Sci. Technol. A 13, 1121 (1995).
10. P. Brüesch, R. Kötz, H. Neff, and L. Pietronero, Phys. Rev. B 29, 4691 (1984).
11. M. M. Smeltzer, J. Electrochem. Soc. 103, 209 (1956), and the references therein.