A complete analysis of the laser beam deflection systems used in cantilever-based systems

Ultramicroscopy

Volumn 107, Issue 4-5, 2007, Pages 422-430

  Beaulieu, L Y ^a   Godin, Michel ^b   Laroche, Olivier ^c   Tabard Cossa, Vincent ^c   Grütter, Peter ^c  

^a MEMORIAL UNIVERSITY OF NEWFOUNDLAND   (Canada)

^b MIT MEDIA LAB   (United States)

^c MCGILL UNIVERSITY   (Canada)

Author keywords

AFM; Cantilever; Cantilever sensor; Optical beam deflection

Indexed keywords

ATOMIC FORCE MICROSCOPY; DETECTORS; GEOMETRY; OPTICS; VECTORS;

CANTILEVER; CANTILEVER SENSORS; OPTICAL BEAM DEFLECTION;

LASER BEAMS;

ACCURACY; ARTICLE; ATOMIC FORCE MICROSCOPY; BEAM THERAPY; BIOSENSOR; COMPUTER PROGRAM; GEOMETRY; LASER; MATHEMATICAL ANALYSIS; OPTICS; PHOTODEGRADATION; SIGNAL DETECTION; SIGNAL TRANSDUCTION;

EID: 33846358731     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.11.001     Document Type: Article

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