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Volumn 68, Issue 1, 1997, Pages 143-149

An optical instrument for overall stress and local stress relaxation analysis in thin metal films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0039205065     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147850     Document Type: Article
Times cited : (10)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.