Radiation effects on advanced hash memories

IEEE Transactions on Nuclear Science

Volumn 46, Issue 6 PART 1, 1999, Pages 1744-1750

  Nguyen, D N ^a   Guertin, S M ^a   Swift, G M ^a   Johnston, A H ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL STORAGE; ELECTRIC POWER SUPPLIES TO APPARATUS; INTEGRATED CIRCUIT LAYOUT; NAND CIRCUITS; SEMICONDUCTOR DEVICE TESTING; THRESHOLD VOLTAGE;

ADVANCED FLASH MEMORIES; SINGLE EVENT TEST;

RADIATION EFFECTS;

EID: 0033306963     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819148     Document Type: Article

References (10)

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