SEE sensitivities of selected advanced flash and first-in-first-out memories

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2004, Pages 47-53

  Koga, R ^a   Tran, V ^a   George, J ^a   Crawford, K ^a   Crain, S ^a   Zakrzewski, M ^a   Yu, P ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

First in first out memory; Flash memory; Single event effects

Indexed keywords

COMMERCIAL-OFF-THE-SHELF (COTS); FIRST-IN-FIRST-OUT MEMORY; METAL OXIDE SEMICONDUCTORS; SINGLE EVENT EFFECT (SEE);

ARRAYS; DATA STORAGE EQUIPMENT; ELECTRIC POTENTIAL; ELECTRONIC EQUIPMENT TESTING; ELECTRONS; HEAVY IONS; SEMICONDUCTOR MATERIALS; SENSITIVITY ANALYSIS; STATIC RANDOM ACCESS STORAGE; TRANSIENTS; TRANSISTORS;

FLASH MEMORY;

EID: 17644369234     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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