Sample-tip interaction of piezoresponse force microscopy in ferroelectric nanostructures

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 53, Issue 12, 2006, Pages 2253-2259

  Peter, Frank ^a   Rüdiger, Andreas ^a   Szot, Krzysztof ^a,b   Waser, Rainer ^a   Reichenberg, Bernd ^c  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b UNIVERSITY OF SILESIA   (Poland)

^c AIXACCT SYSTEMS GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORBENTS; FERROELECTRIC MATERIALS; FINITE ELEMENT METHOD; FORCE MEASUREMENT; MICROSCOPIC EXAMINATION; PARAMETER ESTIMATION;

ADSORBATE EFFECTS; FERROELECTRIC NANOSTRUCTURES; PIEZORESPONSE FORCE MICROSCOPY;

NANOSTRUCTURED MATERIALS;

NANOMATERIAL;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; ELECTROCHEMISTRY; ELECTROMAGNETIC FIELD; IMPEDANCE; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; RADIATION EXPOSURE; ULTRASTRUCTURE;

COMPUTER SIMULATION; ELECTRIC IMPEDANCE; ELECTROCHEMISTRY; ELECTROMAGNETIC FIELDS; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MODELS, CHEMICAL; NANOSTRUCTURES; PARTICLE SIZE;

EID: 33846233782     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2006.170     Document Type: Article

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