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Volumn 303, Issue , 2004, Pages 149-153

Electric field modeling in anisotropic dielectrics

Author keywords

Anisotropic dielectrics; Electric field; Finite element modeling; Scanning probe microscopy

Indexed keywords

CRYSTALLOGRAPHY; ELECTRIC FIELD EFFECTS; FERROELECTRIC MATERIALS; FINITE ELEMENT METHOD; MICROSCOPIC EXAMINATION; PERMITTIVITY;

EID: 33746377017     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190490453117     Document Type: Article
Times cited : (7)

References (12)
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    • Eng, L.M.1    Schlaphof, F.2    Trogisch, S.3    Roelofs, A.4    Waser, R.5
  • 2
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    • Franke, K.1    Besold, J.2    Haessler, W.3    Seegebarth, C.4
  • 3
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    • Nanoscale visualization and control of ferroelectric domains by atomic force microscopy
    • O. Kolosov, A. Gruverman, J. Hatano, K. Takahashi, and H. Tokumoto, Nanoscale visualization and control of ferroelectric domains by atomic force microscopy. Phys. Rev. Lett. 74, 4309-4312 (1995).
    • (1995) Phys. Rev. Lett. , vol.74 , pp. 4309-4312
    • Kolosov, O.1    Gruverman, A.2    Hatano, J.3    Takahashi, K.4    Tokumoto, H.5
  • 4
    • 36549104784 scopus 로고
    • High-resolution capacitance measurement and potentiometry by force microscopy
    • Y. Martin, D. W. Abraham, and H. K. Wickramasinghe, High-resolution capacitance measurement and potentiometry by force microscopy. Appl. Phys. Lett. 52, 1103-1105 (1988).
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  • 7
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    • Differentiating 180° and 90° switching of ferroelectric domains with three-dimensional piezoresponse force microscopy
    • A. Roelofs, U. Böttger, R. Waser, F. Schlaphof, S. Trogisch, and L. M. Eng, Differentiating 180° and 90° switching of ferroelectric domains with three-dimensional piezoresponse force microscopy. Appl. Phys. Lett. 77, 3444-3446 (2000).
    • (2000) Appl. Phys. Lett. , vol.77 , pp. 3444-3446
    • Roelofs, A.1    Böttger, U.2    Waser, R.3    Schlaphof, F.4    Trogisch, S.5    Eng, L.M.6
  • 8
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    • Light confinement in scanning near-field optical microscopy
    • L. Novotny, D. W. Pohl, and B. Hecht, Light confinement in scanning near-field optical microscopy. Ultramicmscopy 61, 1-9 (1995).
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  • 9
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    • Nanometer spot allocation for Raman spectroscopy on ferroelectrics by polarization and piezoresponse force microscopy
    • G. Tarrach, P. Lagos, R. Hermans, F. Schlaphof, Ch. Loppacher, and L. M. Eng, Nanometer spot allocation for Raman spectroscopy on ferroelectrics by polarization and piezoresponse force microscopy. Appl. Phys. Lett. 79, 3152-3154 (2001).
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    • Tarrach, G.1    Lagos, P.2    Hermans, R.3    Schlaphof, F.4    Loppacher, Ch.5    Eng, L.M.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.