Comparison of in-plane and out-of-plane optical amplification in AFM measurements

Review of Scientific Instruments

Volumn 76, Issue 4, 2005, Pages

  Peter, F ^a   Rudiger A ^a   Waser, R ^a   Szot, K ^a,c   Reichenberg, B ^b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b AIXACCT SYSTEMS GMBH   (Germany)

^c UNIVERSITY OF SILESIA   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

LINEAR FUNCTIONS; OPTICAL AMPLIFICATION; PHOTOSENSITIVE DETECTORS; PIEZORESPONSE FORCE MICROSCOPY (PFM);

ATOMIC FORCE MICROSCOPY; ELECTRIC POTENTIAL; IRRADIATION; MORPHOLOGY; PHOTODIODES; PHOTOSENSITIVITY; PIEZOELECTRIC MATERIALS; THIN FILMS;

AMPLIFICATION;

EID: 17644403481     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1878153     Document Type: Article

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