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Volumn 2006, Issue , 2006, Pages 1604-1610

Impact of underfill fillet geometry on interfacial delamination in organic flip chip packages

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACIAL STRESSES; ORGANIC FLIP CHIP PACKAGES; UNDERFILL DELAMINATION; UNDERFILL FILLET GEOMETRY;

EID: 33845592223     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2006.1645871     Document Type: Conference Paper
Times cited : (12)

References (11)
  • 3
    • 3042762896 scopus 로고    scopus 로고
    • Mechanics of interface with applications in electronic packaging
    • H. F. Nied, "Mechanics of Interface with Applications in Electronic Packaging", IEEE Trans on Device and Materials Reliability, 2003, pp 129-143.
    • (2003) IEEE Trans on Device and Materials Reliability , pp. 129-143
    • Nied, H.F.1
  • 4
    • 0742269312 scopus 로고    scopus 로고
    • Evaluation of die edge cracking in flip-chip PBGA packages
    • L.L. Mercado; and V. Sarihan, "Evaluation of Die Edge Cracking in Flip-Chip PBGA Packages", IEEE Trans on Components and Pkg Tech, 2003, Vol 26, # 4, pp 719-723.
    • (2003) IEEE Trans on Components and Pkg Tech , vol.26 , Issue.4 , pp. 719-723
    • Mercado, L.L.1    Sarihan, V.2
  • 5
    • 0035280091 scopus 로고    scopus 로고
    • Investigation of the underfill delamination and cracking in flip-chip modules under temperature cyclic loading
    • X. J. Fan; H.B. Wang; and T.B. Lim, "Investigation of the Underfill Delamination and Cracking in Flip-Chip Modules under Temperature Cyclic Loading", IEEE Trans Components and Pkg Technologies, 2001, Vol 24, #1, pp 84-91.
    • (2001) IEEE Trans Components and Pkg Technologies , vol.24 , Issue.1 , pp. 84-91
    • Fan, X.J.1    Wang, H.B.2    Lim, T.B.3
  • 6
    • 0036473355 scopus 로고    scopus 로고
    • Underfill of flip chip on organic substrate: Viscosity, surface tension, and contact angle
    • J. Wang, "Underfill of Flip Chip on Organic Substrate: Viscosity, Surface tension, and Contact angle", Microelectronics Reliability, 2002, vol 42, pp 293-299.
    • (2002) Microelectronics Reliability , vol.42 , pp. 293-299
    • Wang, J.1
  • 8
    • 0036665640 scopus 로고    scopus 로고
    • Mechanical fatigue test method for chip/underfill delamination in flip chip packages
    • K. Hirohata, et al, "Mechanical Fatigue Test Method for Chip/Underfill Delamination in Flip Chip Packages", IEEE Trans Elec Pkg Manufacturing, 2002, Vol 25, #3, pp 217-222
    • (2002) IEEE Trans Elec Pkg Manufacturing , vol.25 , Issue.3 , pp. 217-222
    • Hirohata, K.1
  • 9
    • 0023172974 scopus 로고
    • Die attachment design and its influence on thermal stresses in the die and the attachment
    • E. Suhir, "Die attachment design and its influence on Thermal Stresses in the die and the attachment", Proc of IEEE Elec Components Tech Conf, 1987, pp 508-517
    • (1987) Proc of IEEE Elec Components Tech Conf , pp. 508-517
    • Suhir, E.1
  • 10
    • 19944411851 scopus 로고    scopus 로고
    • Stress singularities in classical elasticity-I: Removal, Interpretation and analysis
    • July
    • G.B. Sinclair, "Stress singularities in classical elasticity-I: Removal, Interpretation and Analysis", Appl Mech Rev, 2004, vol 57, #4 (July), pp 251-297
    • (2004) Appl Mech Rev , vol.57 , Issue.4 , pp. 251-297
    • Sinclair, G.B.1
  • 11
    • 19944417291 scopus 로고    scopus 로고
    • Stress singularities in classical elasticity-II: Asymptotic identification
    • Sept
    • G.B. Sinclair, "Stress singularities in classical elasticity-II: Asymptotic identification", Appl Mech Rev, 2004, vol 57, #5 (Sept), pp 385-439
    • (2004) Appl Mech Rev , vol.57 , Issue.5 , pp. 385-439
    • Sinclair, G.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.