Graphical peak analysis method for determining densities and emission rates of traps in dielectric film from transient discharge current

Journal of Applied Physics

Volumn 91, Issue 3, 2002, Pages 2085-2092

  Matsuura, Hideharu ^a   Hase, Takashi ^a   Sekimoto, Yasuhiro ^a   Uchikura, Masaharu ^a   Simizu, Masaru ^b  

^a OSAKA ELECTRO COMMUNICATION UNIVERSITY   (Japan)

^b UNIVERSITY OF HYOGO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONSTANT TEMPERATURE; DIELECTRIC THIN FILMS; DISCHARGE CURRENTS; EMISSION RATES; PB(ZR , TI)O; PEAK ANALYSIS; THERMALLY STIMULATED CURRENT; TRANSIENT DISCHARGES;

DIELECTRIC FILMS; LEAD; THIN FILMS; ZIRCONIUM;

PARTICULATE EMISSIONS;

EID: 33845407734     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1429768     Document Type: Article

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