Investigation of transient reverse currents in X-ray detector pin diodes by discharge current transient spectroscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 1, 2000, Pages 178-179

  Matsuura, Hideharu ^a   Segawa, Kazushige ^a  

^a OSAKA ELECTRO COMMUNICATION UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; ELECTRIC CURRENTS; ELECTRIC VARIABLES MEASUREMENT; ELECTRON TRAPS; ELECTRONIC DENSITY OF STATES; NUMERICAL METHODS; SPECTROSCOPY; X RAYS;

DISCHARGE CURRENT TRANSIENT SPECTROSCOPY; TRANSIENT REVERSE CURRENTS; TRAP DENSITIES; X RAY DETECTOR PIN DIODES;

SEMICONDUCTOR DIODES;

EID: 0033904733     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.39.178     Document Type: Article

References (10)

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