A simple graphical method for evaluating the polarization and relaxation times of dipoles or densities and energy levels of traps in a dielectric film from transient discharge current

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 6 A, 1997, Pages 3569-3575

  Matsuura, Hideharu ^a  

^a OSAKA ELECTRO COMMUNICATION UNIVERSITY   (Japan)

Author keywords

Dielectric; Ferroelectric; Gate insulator of FET; Insulator; Polarization; Trap

Indexed keywords

GATE INSULATOR; TRANSIENT DISCHARGE CURRENT DENSITY; TRAP;

CAPACITORS; CURRENT DENSITY; DIELECTRIC FILMS; DIELECTRIC RELAXATION; ELECTRIC INSULATORS; ELECTRODES; ELECTRON ENERGY LEVELS; ELECTRONIC DENSITY OF STATES; FIELD EFFECT TRANSISTORS; POLARIZATION;

GRAPH THEORY;

EID: 0031163083     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.3569     Document Type: Article

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