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Volumn 123-124, Issue , 1998, Pages 237-242

Lineshapes of surface induced optical anisotropy spectra measured by RDS/RAS

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; DIELECTRIC PROPERTIES; ELECTRON ENERGY LEVELS; ELECTRONIC STRUCTURE; SPECTROSCOPIC ANALYSIS;

EID: 0031685715     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00544-8     Document Type: Article
Times cited : (33)

References (21)
  • 13
    • 0041591425 scopus 로고    scopus 로고
    • Proc. of the Int. Conf. on Spectroscopic Ellipsometry (ICSE-2), in press
    • K. Uwai, Y. Watanabe, N. Kobayashi, in: Proc. of the Int. Conf. on Spectroscopic Ellipsometry (ICSE-2), Thin Solid Films (in press).
    • Thin Solid Films
    • Uwai, K.1    Watanabe, Y.2    Kobayashi, N.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.