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Volumn 14, Issue 2, 1996, Pages 1043-1047

Nanoscale roughening of Si(001) by oxide desorption in ultrahigh vacuum

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0346189091     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588451     Document Type: Article
Times cited : (23)

References (19)
  • 19
    • 0029250115 scopus 로고
    • D. Dijkkamp, E. J. van Loenen, A. J. Hoeven, and J. Dieleman, J. Vac. Sci. Technol. A 8, 218 (1990). Most recently; A. W. Munz, Ch. Ziegler, and W. Göpel, Surf. Sci. 325, 177 (1995).
    • (1995) Surf. Sci. , vol.325 , pp. 177
    • Munz, A.W.1    Ziegler, Ch.2    Göpel, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.