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Volumn 40, Issue 4-6 SPEC. ISS., 2006, Pages 507-512
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Vertical electron transport study in GaN/AlN/GaN heterostructures
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Author keywords
Conductive atomic force microscopy; GaN; Resonant tunneling diode; Two dimensional electron gas
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRON GAS;
ELECTRON TRANSPORT PROPERTIES;
ELECTRONIC STRUCTURE;
GALLIUM COMPOUNDS;
MOLECULAR BEAM EPITAXY;
RESONANT TUNNELING;
CONDUCTIVE ATOMIC FORCE MICROSCOPY;
GAN;
RESONANT TUNNELING DIODES;
TWO DIMENSIONAL ELECTRON GAS;
HETEROJUNCTIONS;
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EID: 33845208794
PISSN: 07496036
EISSN: 10963677
Source Type: Journal
DOI: 10.1016/j.spmi.2006.10.008 Document Type: Article |
Times cited : (6)
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References (12)
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