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Volumn 40, Issue 4-6 SPEC. ISS., 2006, Pages 507-512

Vertical electron transport study in GaN/AlN/GaN heterostructures

Author keywords

Conductive atomic force microscopy; GaN; Resonant tunneling diode; Two dimensional electron gas

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON GAS; ELECTRON TRANSPORT PROPERTIES; ELECTRONIC STRUCTURE; GALLIUM COMPOUNDS; MOLECULAR BEAM EPITAXY; RESONANT TUNNELING;

EID: 33845208794     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2006.10.008     Document Type: Article
Times cited : (6)

References (12)
  • 9
    • 33845233188 scopus 로고    scopus 로고
    • WinGreen. Available on-line: http://www.fz-juelich.de/isg/mbe/software.html
  • 10
    • 33845203192 scopus 로고    scopus 로고
    • 3. Available on-line: http://www.nextnano.de


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.