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Volumn 89, Issue 22, 2006, Pages

Defect induced formation of CoSi2 nanowires by focused ion beam synthesis

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ION BEAMS; ION IMPLANTATION; NANOSTRUCTURED MATERIALS; SYNTHESIS (CHEMICAL); TEMPERATURE DISTRIBUTION;

EID: 33751560410     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2400068     Document Type: Article
Times cited : (14)

References (19)
  • 1
    • 0032562718 scopus 로고    scopus 로고
    • G. Fasol, Science 280, 545 (1998).
    • (1998) Science , vol.280 , pp. 545
    • Fasol, G.1
  • 19
    • 33751564895 scopus 로고    scopus 로고
    • E-MRS Spring Meeting 2006, Nice, France, 29 May-2 June
    • S. Boninelli, N. Cherkashin, A. Claverie, and F. Cristiano, E-MRS Spring Meeting 2006, Nice, France, 29 May-2 June 2006 (unpublished).
    • (2006)
    • Boninelli, S.1    Cherkashin, N.2    Claverie, A.3    Cristiano, F.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.