Adaptable end effector for atomic force microscopy based nanomanipulation

IEEE Transactions on Nanotechnology

Volumn 5, Issue 6, 2006, Pages 628-642

  Zhang, Jiangbo ^a,b   Xi, Ning ^a,b   Li, Guangyong ^a,b   Chan, Ho Yin ^a,b   Wejinya, Uchechukwu C ^a,b  

^a IEEE   (United States)

^b Michigan State University   (United States)

Author keywords

Atomic force microscopy (AFM); Flexible beam; Nanomanipulation; Nanorobotics

Indexed keywords

FLEXIBLE BEAM; NANOMANIPULATION; NANOROBOTICS;

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; NONLINEAR SYSTEMS; PROBLEM SOLVING; ROBOTICS; UNCERTAIN SYSTEMS;

NANOTECHNOLOGY;

EID: 33751522244     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2006.883482     Document Type: Article

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