Comparison of performance limits for carbon nanoribbon and carbon nanotube transistors

Applied Physics Letters

Volumn 89, Issue 20, 2006, Pages

  Ouyang, Yijian ^a   Yoon, Youngki ^a   Fodor, James K ^a   Guo, Jing ^a  

^a University of Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; ELECTRIC CONDUCTANCE; ELECTRIC CURRENTS; FIELD EFFECT TRANSISTORS; QUANTUM THEORY; VELOCITY MEASUREMENT;

BALLISTIC TRANSPORT; DEGENERACY FACTORS; INTRINSIC SPEED; NANORIBBONS;

CARBON NANOTUBES;

EID: 33751094287     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2387876     Document Type: Article

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