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Volumn 24, Issue 6, 2006, Pages 2122-2127

Reactive sputter-deposition of AlN films by dense plasma focus

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM NITRIDE; ANODES; MICROHARDNESS; PLASMA APPLICATIONS; RAMAN SPECTROSCOPY; SILICON; SPUTTER DEPOSITION; X RAY DIFFRACTION ANALYSIS;

EID: 33750956015     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2357743     Document Type: Article
Times cited : (7)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.