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Volumn 515, Issue 4, 2006, Pages 2366-2372
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Charge trapping and carrier transport mechanism in silicon-rich silicon oxynitride
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Author keywords
Carrier transport mechanism; Charge trapping; Silicon nanodots; Silicon rich silicon oxynitride
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
NANOSTRUCTURED MATERIALS;
TRANSMISSION ELECTRON MICROSCOPY;
CARRIER TRANSPORT;
SILICON NANODOTS;
SILICON-RICH SILICON OXYNITRIDE;
SILICON COMPOUNDS;
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EID: 33750831835
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2006.04.009 Document Type: Article |
Times cited : (12)
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References (18)
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