Static solvent contact angle measurements, surface free energy and wettability determination of various self-assembled monolayers on silicon dioxide

Thin Solid Films

Volumn 515, Issue 4, 2006, Pages 1433-1438

  Janssen, Dimitri ^a,b   De Palma, Randy ^a,b   Verlaak, Stijn ^b   Heremans, Paul ^b   Dehaen, Wim ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b IMEC   (Belgium)

Author keywords

Monolayer; Organic semiconductor; Surface energy; Wetting

Indexed keywords

FREE ENERGY; SELF ASSEMBLY; SEMICONDUCTING ORGANIC COMPOUNDS; SOLVENTS;

ORGANIC ELECTRONICS; OWENS-WENDT-RABEL-KAELBLE METHOD; STATIC SOLVENT CONTACT ANGLE;

SILICA;

EID: 33750813035     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.04.006     Document Type: Article

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