Photochemistry and patterning of monolayer films from 11- phenylundecyltrichlorosilane

Langmuir

Volumn 20, Issue 10, 2004, Pages 4295-4298

  Friedli, Andrienne C ^a   Roberts, Rachel D ^a,b   Dulcey, Charles S ^c   Hsu, Andro R ^b   McElvany, Stephen W ^c   Calvert, Jeffrey M ^c,d  

^a MIDDLE TENNESSEE STATE UNIVERSITY   (United States)

^b SCIENCE APPLICATIONS INTERNATIONAL CORPORATION   (United States)

^c NAVAL RESEARCH LABORATORY   (United States)

^d SHIPLEY COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

METAL DEPOSITION; PATTERNING; PHOTOPATTERNED; PYRIDYL;

CARBONYLATION; CATALYSTS; DEPOSITION; DESORPTION; FOURIER TRANSFORMS; LASERS; MASS SPECTROMETRY; METALS; OPTICAL RESOLVING POWER; PATTERN RECOGNITION; PHOTOCHEMICAL REACTIONS; SILICON WAFERS; ULTRAVIOLET LAMPS;

MONOLAYERS;

MONOLAYERS; PATTERN RECOGNITION; PHOTOCHEMISTRY;

EID: 2542634932     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la030353m     Document Type: Article

References (37)

1. Ulman, A. Chem. Rev. 1996, 96, 1533-1554 and references therein.
2. Plueddemann, E. P. Silane Coupling Agents; Plenum Press: New York, 1982.
3. For example: Collins, R. J.; Bae, I. T.; Scherson, D. A.; Sukenik, C. N. Langmuir 1996, 12, 5509-5511. Wrighton, M. S.; Rozsnyai, L. F. Langmuir 1995, 11, 3913-3920. Fodor, S. P. A.; Read, J. L.; Pirrung, M. C.; Stryer, L.; Lu, A. T.; Solas, D. Science 1991, 251, 767-773.
4. For example: Collins, R. J.; Bae, I. T.; Scherson, D. A.; Sukenik, C. N. Langmuir 1996, 12, 5509-5511. Wrighton, M. S.; Rozsnyai, L. F. Langmuir 1995, 11, 3913-3920. Fodor, S. P. A.; Read, J. L.; Pirrung, M. C.; Stryer, L.; Lu, A. T.; Solas, D. Science 1991, 251, 767-773.
5. For example: Collins, R. J.; Bae, I. T.; Scherson, D. A.; Sukenik, C. N. Langmuir 1996, 12, 5509-5511. Wrighton, M. S.; Rozsnyai, L. F. Langmuir 1995, 11, 3913-3920. Fodor, S. P. A.; Read, J. L.; Pirrung, M. C.; Stryer, L.; Lu, A. T.; Solas, D. Science 1991, 251, 767-773.
6. Calvert, J. M. In Thin Films; Ulman, A., Ed.; Academic Press: Boston, 1995, Vol. 20, 109-141 and references therein.
7. Dulcey, C. S.; Georger, J. H., Jr.; Chen, M.-S.; McElvany, S. W.; O'Ferrall, C. E.; Benezra, V. I.; Calvert, J. M. Langmuir 1996, 12, 1638-1650.
8. Stenger, D. A.; Georger, J. H.; Dulcey, C. S.; Hickman, J. J.; Rudolph, A. S.; Nielson, T. B.; McCort, S. M.; Calvert, J. M. J. Am. Chem. Soc. 1992, 114, 8435-8442.
9. Yang, X. M.; Peters, R. D.; Kim, T. K.; Nealey, P. F. J. Vac. Sci. Technol., B 1999, 17 (6), 3203-3207.
10. Kim, T. K.; Yang, X. M.; Peters, R. D.; Sohn, B. H.; Nealey, P. F. J. Phys. Chem. B 2000, 104, 7403-7410 and references therein.
11. Perkins, F. K.; Dobisz, E. A.; Brandow, S. L.; Calvert, J. M.; Kosakowski, J. E.; Marrian, C. R. K. Appl. Phys. Lett. 1996, 68, 550-552 and references therein.
12. Ada, E. T.; Hanley, L.; Etchin, S.; Melngailis, J.; Dressick, W. J.; Chen, M.-S.; Calvert, J. M. J. Vac. Sci. Technol., B 1995, 13, 2189-2196.
13. Brandow, S. L.; Chen, M.-S.; Aggarwal, R.; Dulcey, C. S.; Calvert, J. M.; Dressick, W. J. Langmuir 1999, 15, 5429-5432.
14. Dressick, W. J.; Chen, M.-S.; Brandow, S. L. J. Am. Chem. Soc. 2000, 122, 982-983.
15. Wasserman, S. R.; Tao, Y.-T.; Whiteaides, G. M. Langmuir 1989, 5, 1074-1087.
16. Friedli, A. C.; Dulcey, C. S.; Hsu, A. R.; Roberts, R. D.; Calvert, J. M. Book of Abstracts; 209th National American Chemical Society Meeting, Anaheim, CA, April 2-5, 1995. Abstract COL 010. Friedli, A. C.; Dulcey, C. S.; Hsu, A. R.; Roberts, R. D.; Calvert, J. M. Abstracts, Materials Research Society Meeting; Boston, MA, Nov. 27-Dec. 1, 1995, Abstract 0157.
17. Friedli, A. C.; Dulcey, C. S.; Hsu, A. R.; Roberts, R. D.; Calvert, J. M. Book of Abstracts; 209th National American Chemical Society Meeting, Anaheim, CA, April 2-5, 1995. Abstract COL 010. Friedli, A. C.; Dulcey, C. S.; Hsu, A. R.; Roberts, R. D.; Calvert, J. M. Abstracts, Materials Research Society Meeting; Boston, MA, Nov. 27-Dec. 1, 1995, Abstract 0157.
18. 3Si: C, 55.81; H, 7.44; Si, 7.68. Found: C, 56.17; H, 7.69; Si, 8.21.
19. 4).
20. Tillman, N.; Ulman, A.; Schildkraut, J. S.; Penner, T. L. J. Am. Chem. Soc. 1988, 110, 6136-6144.
21. Friedli, A. C.; Dulcey, C. S.; Hsu, A. R.; Roberts, R. D.; MoElvany, S. W.; Holliman, C. L.; Calvert, J. M. Unpublished results.
22. 5
23. Hydrolytic instability is linked to film disorder. Brzoska, J. B.; Azouz, I. B.; Rondelez, F. Langmuir 1994, 10, 4367-4373 and references therein.
24. 4 cantilevers in contact mode under water.
25. The LD-FTMB experiments were performed with a Cymer ArF excimer laser (193 nm) in a vacuum chamber. The experimental configuration is described in ref 5.
26. McElvany, S. W.; Holliman, C. L. Unpublished results.
27. Calculations using the AMI Hamiltonian (MOPAC 6.0 package) find that the bond most likely to undergo homolytic cleavage is the carbon-carbon bond at the benzyl postion (C-C-Ph) in 11-phenyl-undecylsilanetriol. The second weakest bond is the benzyl C-H bond.
28. Wasserman, S. R.; Whitesides, G. M.; Tidswell, I. M.; Ocko, B. M.; Pershan, P. S.; Axe, J. D. J. Am. Chem. Soc. 1989, 111, 5852-5861.
29. 4 for 30 min resulted in bromination of samples and unirradiated controls, as determined by XPS.
30. -1 in ethanol (Lockhart, E. E.; Merritt, M. C.; Mead, C. D. J. Am. Chem. Soc. 1951, 73, 858-859).
31. -1 in ethanol (Lockhart, E. E.; Merritt, M. C.; Mead, C. D. J. Am. Chem. Soc. 1951, 73, 858-859).
32. Durfor, C. N. Turner, D. C.; Georger, J. H.; Peek, B. M.; Stenger, D. A. Langmuir 1994, 10, 148-152.
33. Fryxell, G. E.; Rieke, P. C.; Wood, L. L.; Engelhard, M. H.; Williford, R. E.; Graff, G. L.; Campbell, A. A.; Wiaoek, R. J.; Lee, L.; Halverson, A. Langmuir 1996, 12, 5064-5075. Kurth, D. G.; Bein, T. Langmuir 1993, 9, 2965-2973.
34. Fryxell, G. E.; Rieke, P. C.; Wood, L. L.; Engelhard, M. H.; Williford, R. E.; Graff, G. L.; Campbell, A. A.; Wiaoek, R. J.; Lee, L.; Halverson, A. Langmuir 1996, 12, 5064-5075. Kurth, D. G.; Bein, T. Langmuir 1993, 9, 2965-2973.
35. Doppelt, P. Coord. Chem. Rev. 1998, 178-180, 1785.
36. Dressick, W. J.; Dulcey, C. S.; Georger, J. H.; Calvert, J. M. Chem. Mater. 1993, 5, 148-150.
37. Dressick, W. J.; Chen, M.-S.; Brandow, S. L.; Rhee, K. W.; Shirley, L. M.; Perkins, F. K. Appl. Phys. Lett. 2001, 78, 676-678.