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Volumn 14, Issue 4, 1996, Pages 2485-2492
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Surface tension, adhesion and wetting of materials for photolithographic process
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Author keywords
[No Author keywords available]
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Indexed keywords
ADHESION;
ALUMINUM COPPER ALLOYS;
ANGLE MEASUREMENT;
AROMATIC COMPOUNDS;
CONTACT ANGLE;
OPTIMIZATION;
PHOTOLITHOGRAPHY;
PHOTORESISTS;
SEMICONDUCTOR MATERIALS;
SURFACE TREATMENT;
WETTING;
FILM THICKNESS;
HEXAMETHYLDISILAZANE;
PRIMERS;
SURFACE MODIFICATION;
TRIMETHYLSILYDIETHYLAMINE;
SURFACE TENSION;
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EID: 0030194145
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.588757 Document Type: Article |
Times cited : (44)
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References (23)
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