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Volumn 53, Issue 11, 2006, Pages 2764-2772

A comparison of bulk lifetime, efficiency, and light-induced degradation in boron- and gallium-doped cast mc-Si solar cells

Author keywords

Light induced degradation (LID); Minority carrier lifetime; Multicrystalline silicon (mc Si); Photovoltaic cell efficiency

Indexed keywords

EFFICIENCY; MATHEMATICAL MODELS; PHOTODEGRADATION; PHOTOVOLTAIC CELLS; SEMICONDUCTING BORON; SEMICONDUCTING GALLIUM; SEMICONDUCTOR DOPING; SILICON WAFERS;

EID: 33750593627     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2006.883675     Document Type: Article
Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.