Impact of defect distribution and impurities on multicrystalline silicon cell efficiency

Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion

Volumn B, Issue , 2003, Pages 1044-1047

  Geerligs, L J ^a  

^a TNO   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT DISTRIBUTION; FEEDSTOCK PURITY; INJECTION LEVELS; SILCON CELLS;

CONTAMINATION; CRYSTAL DEFECTS; ERROR ANALYSIS; IRON; OPTIMIZATION; OXYGEN; SILICON WAFERS;

POLYSILICON;

EID: 6444236359     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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2. methodology as in A. Schönecker et al., J. Appl. Phys. 79, 1497 (1996).
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4. D.H. Macdonald et al., to be published.
5. M. Acciarri et al., 13th European PVSEC, 1336 (1995).
6. th workshop on crystalline silicon solar cell materials and processes, (NREL, 2003) p. 216.
7. A.A. Istratov, H. Hieslmair, E.R. Weber., Appl. Phys. A 69, 13 (1999); ibidem 70, 489 (2000).
8. A.A. Istratov, H. Hieslmair, E.R. Weber., Appl. Phys. A 69, 13 (1999); ibidem 70, 489 (2000).
9. C. Ballif et al., 17th European PVSEC, 1818 (2001).
10. for relation of lifetime distribution to cell results, see, e.g., W. Warta et al., 2nd World Conference on PVSEC, 1650 (1998); B.L. Sopori, Mater. Sci. Forum 258-263, 527 (1997); J. Isenberg et al., 29th IEEE PVSC, (2002), and references therein.
11. for relation of lifetime distribution to cell results, see, e.g., W. Warta et al., 2nd World Conference on PVSEC, 1650 (1998); B.L. Sopori, Mater. Sci. Forum 258-263, 527 (1997); J. Isenberg et al., 29th IEEE PVSC, (2002), and references therein.
12. for relation of lifetime distribution to cell results, see, e.g., W. Warta et al., 2nd World Conference on PVSEC, 1650 (1998); B.L. Sopori, Mater. Sci. Forum 258-263, 527 (1997); J. Isenberg et al., 29th IEEE PVSC, (2002), and references therein.
13. S. McHugo et al., Physica B 273-274, 371 (1999).