메뉴 건너뛰기




Volumn 8, Issue 5, 2000, Pages 537-547

Overview of light degradation research on crystalline silicon solar cells

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL IMPURITIES; CRYSTALLINE MATERIALS; DEGRADATION; MATHEMATICAL MODELS; OXIDATION; SEMICONDUCTOR DOPING; SILICON WAFERS; SUBSTITUTION REACTIONS;

EID: 0034263088     PISSN: 10627995     EISSN: None     Source Type: Journal    
DOI: 10.1002/1099-159X(200009/10)8:5<537::AID-PIP349>3.0.CO;2-W     Document Type: Article
Times cited : (43)

References (22)
  • 1
    • 0008504101 scopus 로고    scopus 로고
    • PV Energy Systems, Inc. Feb.
    • Maycock P. PV News, PV Energy Systems, Inc. Feb. 2000.
    • (2000) PV News
    • Maycock, P.1
  • 9
    • 0001612762 scopus 로고    scopus 로고
    • Electronic properties of light-induced recombination centers in boron-doped Czochralski silicon
    • Schmidt J. Cuevas A. Electronic properties of light-induced recombination centers in boron-doped Czochralski silicon. J. Appl. Phys. 1999; 86(6): 3175-3180.
    • (1999) J. Appl. Phys. , vol.86 , Issue.6 , pp. 3175-3180
    • Schmidt, J.1    Cuevas, A.2
  • 13
    • 0033365078 scopus 로고    scopus 로고
    • Comparison of boron- And gallium-doped p-type Czochralski silicon for photovoltaic application
    • Glunz SW, Rein S, Knobloch J, Wettling W, Abe T. Comparison of boron- and gallium-doped p-type Czochralski silicon for photovoltaic application. Progress in Photovoltaics 1999; 7: 463-469.
    • (1999) Progress in Photovoltaics , vol.7 , pp. 463-469
    • Glunz, S.W.1    Rein, S.2    Knobloch, J.3    Wettling, W.4    Abe, T.5
  • 14
    • 0033364929 scopus 로고    scopus 로고
    • 24·5% efficiency silicon PERT cells on MCZ substrates and 24·7% efficiency PERL cells on FZ substrates
    • Zhao J, Wang A, Green MA. 24·5% efficiency silicon PERT cells on MCZ substrates and 24·7% efficiency PERL cells on FZ substrates. Progress in Photovoltaics 1999; 7: 471-474.
    • (1999) Progress in Photovoltaics , vol.7 , pp. 471-474
    • Zhao, J.1    Wang, A.2    Green, M.A.3
  • 16
    • 0027187313 scopus 로고
    • In situ bulk lifetime measurement on silicon with a chemically passivated surface
    • Horanyi TS. Pavelka T, Tüttö P. In situ bulk lifetime measurement on silicon with a chemically passivated surface. Appl. Surface Science 1993; 63: 306-311.
    • (1993) Appl. Surface Science , vol.63 , pp. 306-311
    • Horanyi, T.S.1    Pavelka, T.2    Tüttö, P.3
  • 18
    • 0000513411 scopus 로고    scopus 로고
    • Contactless determination of current-voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data. App
    • Sinton RA, Cuevas A. Contactless determination of current-voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data. App. Phys. Lett. 1996; 69: 2510-2512.
    • (1996) Phys. Lett. , vol.69 , pp. 2510-2512
    • Sinton, R.A.1    Cuevas, A.2
  • 20
    • 0343719989 scopus 로고    scopus 로고
    • Extended Abstracts of 47th Spring Meeting of Japan
    • in Japanese
    • Tomizuka S, Hashigami H, Saitoh T. Extended Abstracts of 47th Spring Meeting of Japan. Appl. Phys. 2000; 2: 913 (in Japanese).
    • (2000) Appl. Phys. , vol.2 , pp. 913
    • Tomizuka, S.1    Hashigami, H.2    Saitoh, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.