Characterization of aggregates in very thin layers by small-angle X-ray scattering using grazing incidence

Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques

Volumn 88, Issue 8, 1997, Pages 596-600

  Naudon, André ^a   Babonneau, David ^a  

^a UNIVERSITÉ DE POITIERS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE SCATTERING; ELECTROMAGNETIC WAVE TRANSMISSION; SYNCHROTRONS; THIN FILMS; X RAY ANALYSIS;

GRAZING INCIDENCE SMALL ANGLE X RAY SCATTERING;

NANOSTRUCTURED MATERIALS;

EID: 0031210699     PISSN: 00443093     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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