X-ray scattering by nano-particles within granular thin films, investigation by grazing angle X-ray reflectometry

European Physical Journal B

Volumn 7, Issue 3, 1999, Pages 339-345

  Maaza M ^a,b   Gibaud, A ^a   Sella, C ^c   Pardo, B ^b   Dunsteter, F ^e   Corno, J ^b   Bridou, F ^b   Vignaud, G ^a   Desert A ^a   Menelle, A ^d  

^a UNIVERSITÉ DU MAINE   (France)

^b INSTITUT D'OPTIQUE GRADUATE SCHOOL   (France)

^c SORBONNE UNIVERSITÉ   (France)

^d CEA SACLAY   (France)

^e LABORATOIRE DES SOLIDES IRRADIÉS   (France)

Author keywords

61.10.Kw X ray reflectometry (surfaces, interfaces, films); 61.46.+w clusters, nanoparticles,and nanocrystalline materials; 68.55. a thin film structure and morphology

Indexed keywords

EID: 0043284486     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1007/s100510050620     Document Type: Article

References (32)

1. G. Kostorz, in Treatise on Materials Science & Technology, edited by G. Kostorz (New York, Academic Press, 1979) Vol. 15, pp. 227-289.
2. A. Guinier, C. R. Acad. Sci. 206, 1374 (1938); A. Guinier, G. Fournet, in Small Angle scattering of X-rays (Wiley, New York, 1955).
3. A. Guinier, C. R. Acad. Sci. 206, 1374 (1938); A. Guinier, G. Fournet, in Small Angle scattering of X-rays (Wiley, New York, 1955).
4. W.W. Beeman, P. Kaesberg, H.N. Ritland, Phys. Rev. 78, 336 (1950).
5. O. Kratky, Kolloid. Z. 64, 213 (1933).
6. H. Rauch, W. Treimer, U. Bonse, Phys. Lett. A 47, 369 (1974).
7. U. Bonse, M. Hart, Appl. Phys. Lett. 6, 155 (1965).
8. H. Dosch, Int. J. Mod. Phys. 6, 2773 (1992) and references therein; H. Dosch, in Critical Phenomena at Surfaces & Interfaces: Evanescent X-ray and neutron scattering, in Springer Tracts in Modern Physics (Springer, Heidelberg, 1992) and references therein. H. Dosch, T. Hšfer, J. Peisl, R.L. Johnson, Europhys. Lett. 15, 527 (1991); H. Dosch, J. Peisl, K. Al Usta, Z. Phys. B 79, 409 (1990).
9. H. Dosch, Int. J. Mod. Phys. 6, 2773 (1992) and references therein; H. Dosch, in Critical Phenomena at Surfaces & Interfaces: Evanescent X-ray and neutron scattering, in Springer Tracts in Modern Physics (Springer, Heidelberg, 1992) and references therein. H. Dosch, T. Hšfer, J. Peisl, R.L. Johnson, Europhys. Lett. 15, 527 (1991); H. Dosch, J. Peisl, K. Al Usta, Z. Phys. B 79, 409 (1990).
10. H. Dosch, Int. J. Mod. Phys. 6, 2773 (1992) and references therein; H. Dosch, in Critical Phenomena at Surfaces & Interfaces: Evanescent X-ray and neutron scattering, in Springer Tracts in Modern Physics (Springer, Heidelberg, 1992) and references therein. H. Dosch, T. Hšfer, J. Peisl, R.L. Johnson, Europhys. Lett. 15, 527 (1991); H. Dosch, J. Peisl, K. Al Usta, Z. Phys. B 79, 409 (1990).
11. H. Dosch, Int. J. Mod. Phys. 6, 2773 (1992) and references therein; H. Dosch, in Critical Phenomena at Surfaces & Interfaces: Evanescent X-ray and neutron scattering, in Springer Tracts in Modern Physics (Springer, Heidelberg, 1992) and references therein. H. Dosch, T. Hšfer, J. Peisl, R.L. Johnson, Europhys. Lett. 15, 527 (1991); H. Dosch, J. Peisl, K. Al Usta, Z. Phys. B 79, 409 (1990).
12. S. Dietrich, A. Haase, Phys. Rep. 260, (1995) and references therein; S. Dietrich, H. Wagner, Phys. Rev. Lett. 51, 1469 (1983); S. Dietrich, H.W. Diehl, Z. Phys. B 51, 343 (1983).
13. S. Dietrich, A. Haase, Phys. Rep. 260, (1995) and references therein; S. Dietrich, H. Wagner, Phys. Rev. Lett. 51, 1469 (1983); S. Dietrich, H.W. Diehl, Z. Phys. B 51, 343 (1983).
14. S. Dietrich, A. Haase, Phys. Rep. 260, (1995) and references therein; S. Dietrich, H. Wagner, Phys. Rev. Lett. 51, 1469 (1983); S. Dietrich, H.W. Diehl, Z. Phys. B 51, 343 (1983).
15. T. Salditt, T.H. Metzger, J. Peisl, X. Jiang, L. Phys. 4, 1573 (1994); T. Salditt, T.H. Metzger, J. Peisl, Phys. Rev. Lett. 73, 2228 (1994).
16. T. Salditt, T.H. Metzger, J. Peisl, X. Jiang, L. Phys. 4, 1573 (1994); T. Salditt, T.H. Metzger, J. Peisl, Phys. Rev. Lett. 73, 2228 (1994).
17. J.R. Levine, J.B. Cohen, Y.W. Chung, P. Georgopoulos, J. Appl. Cryst. 22, 528 (1989); J.R. Levine, J.B. Cohen, Y.W. Chung, Surf. Sci. 248, 215 (1991); J.R. Levine, P. Georgopoulos, Y.W. Chung, J.B. Cohen, J. Phys. IV Colloq. France 3, C8-411 (1993).
18. J.R. Levine, J.B. Cohen, Y.W. Chung, P. Georgopoulos, J. Appl. Cryst. 22, 528 (1989); J.R. Levine, J.B. Cohen, Y.W. Chung, Surf. Sci. 248, 215 (1991); J.R. Levine, P. Georgopoulos, Y.W. Chung, J.B. Cohen, J. Phys. IV Colloq. France 3, C8-411 (1993).
19. J.R. Levine, J.B. Cohen, Y.W. Chung, P. Georgopoulos, J. Appl. Cryst. 22, 528 (1989); J.R. Levine, J.B. Cohen, Y.W. Chung, Surf. Sci. 248, 215 (1991); J.R. Levine, P. Georgopoulos, Y.W. Chung, J.B. Cohen, J. Phys. IV Colloq. France 3, C8-411 (1993).
20. A. Naudon, T. Slimani, P. Goudeau, J. Appl. Cryst. 24, 501 (1991), see also A. Naudon, D. Thiaudire, J.J. Arnault, J. Delafond, C. Templier, C.R.A.S.T. 317 (1993).
21. A. Naudon, T. Slimani, P. Goudeau, J. Appl. Cryst. 24, 501 (1991), see also A. Naudon, D. Thiaudire, J.J. Arnault, J. Delafond, C. Templier, C.R.A.S.T. 317 (1993).
22. M. Rauscher, T. Salditt, H. Spohn, Phys. Rev. B. 52. 16855 (1996).
23. T.J. Davis, Acta. Cryst. A 50, 686 (1994).
24. B.K. Vainshtein, in Diffraction of X-rays by Chain Molecules (Elsevier, Amsterdam-London-New York, 1966).
25. C. Sella, T.K. Vien, J. Lafait, S. Berthier, Thin Solid Films 80, 425 (1982).
26. H.G. Craighead, Proc. Soc. Phot. Opt. Instr. Eng. 40, 356 (1982).
27. D. Cribier, B. Jacrot, L. Madhav Rao, B. Farnoux, Phys. Lett. 9, 106 (1964).
28. H.R. Zeller, I. Giaever, Phys. Rev. 181, 789 (1969).
29. S.K. Sinha, E.B. Sirota, S. Garoff, H.B. Stanley, Phys. Rev. B 38, 2297 (1988), also A. Steyerl, S.S. Malik, L.R. Iyengar, Physica B 173, 47 (1991).
30. S.K. Sinha, E.B. Sirota, S. Garoff, H.B. Stanley, Phys. Rev. B 38, 2297 (1988), also A. Steyerl, S.S. Malik, L.R. Iyengar, Physica B 173, 47 (1991).
31. P. Croce, L. Prod'homme, Rev. Phys. Appl. 12, 1641 (1977), also J.P. Chauvineau, Y. Chambet, C. Marlire, in Optical Interference Coatings Proceeding, edited by F. Abels (1995), pp. 260-267.
32. P. Croce, L. Prod'homme, Rev. Phys. Appl. 12, 1641 (1977), also J.P. Chauvineau, Y. Chambet, C. Marlire, in Optical Interference Coatings Proceeding, edited by F. Abels (1995), pp. 260-267.