Charge transport along luminescent oxide layers containing Si and SiC nanoparticles

Journal of Luminescence

Volumn 121, Issue 2 SPEC. ISS., 2006, Pages 356-360

  Jambois, O ^a   Vila A ^a   Pellegrino, P ^a   Carreras, J ^a   Perez Rodriguez A ^a   Garrido, B ^a   Bonafos, C ^b   BenAssayag, G ^b  

^a UNIVERSITY OF BARCELONA   (Spain)

^b CEMES CNRS   (France)

Author keywords

Electrical characterization; FIB; Optoelectronic devices; Si nanocrystals; SiC nanoparticles

Indexed keywords

CHARACTERIZATION; ELECTRIC CONDUCTIVITY; ION BEAMS; ION IMPLANTATION; LUMINESCENCE; OPTOELECTRONIC DEVICES; SILICON CARBIDE;

ELECTRIC CHARACTERIZATION; ELECTRIC TRANSPORT; FOCUSED ION BEAMS; NANOCRYSTALS;

NANOSTRUCTURED MATERIALS;

EID: 33750312807     PISSN: 00222313     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jlumin.2006.08.067     Document Type: Article

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