Time-resolved analysis of the white photoluminescence from SiO2 films after Si and C coimplantation

Applied Physics Letters

Volumn 84, Issue 1, 2004, Pages 25-27

  Pellegrino, P ^a   Perez Rodriguez A ^a   Garrido, B ^a   Gonzalez Varona O ^a   Morante, J R ^a   Marcinkevicius S ^b   Galeckas, A ^b   Linnros, J ^b  

^a UNIVERSITY OF BARCELONA   (Spain)

^b ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; LIGHT EMISSION; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; OPTICAL DEVICES; PHOTOLUMINESCENCE; POSITIVE IONS; RADIATION; RELAXATION PROCESSES; SPECTROSCOPIC ANALYSIS; STOICHIOMETRY;

NANOCRYSTALS; OPTICAL EFFICIENCY;

SILICA;

EID: 0942278027     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1634692     Document Type: Article

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