Exact wave-front reconstruction from two lateral shearing interferograms

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 16, Issue 9, 1999, Pages 2281-2285

  Elster, C ^a   Weingartner I ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000834058     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.16.002281     Document Type: Article

References (25)

1. S. Bäumer, “Quantitative Mikro-Messtechnik mit einem Lateral Shearing Interferometer,” Ph.D. thesis (Optics Institute, Berlin Technical University, Berlin, 1995).
2. K. R. Freischlad and C. L. Koliopoulos, “Modal estimation of a wave front from difference measurements using the discrete Fourier transform,” J. Opt. Soc. Am. A 3, 1852–1861 (1986).
3. G. Harbers, P. J. Kunst, and G. W. R. Leibbrandt, “Analysis of lateral shearing interferograms by use of Zernike polynomials,” Appl. Opt. 35, 6162–6172 (1996).
4. H. Schreiber and J. Schwider, “Lateral shearing interferometer based on two Ronchi gratings in series,” Appl. Opt. 36, 5321–5324 (1997).
5. M. Servin, D. Malacara, and J. L. Marroquin, “Wave-front recovery from two orthogonal sheared interferograms,” Appl. Opt. 35, 4343–4348 (1996).
6. F. Roddier and C. Roddier, “Phase closure with rotational shear interferometers,” Opt. Commun. 60, 350–352 (1986).
7. E. Ribak, “Phase closure with rotational shear interferometer,” Appl. Opt. 26, 197–199 (1987).
8. J. W. Hardy, J. E. Lefebvre, and C. L. Koliopoulos, “Realtime atmospheric compensation,” J. Opt. Soc. Am. 67, 360–369 (1977).
9. S. N. Srivastava, M. S. Tomar, and R. S. Kasana, “Determination of the linear thermal expansion coefficient of long metallic bars by a Murty shearing interferometer,” Opt. Laser Technol. 22, 283–286 (1990).
10. H. von Brug, “Zernike polynomials as a basis for wave-front fitting in lateral shearing interferometry,” Appl. Opt. 36, 2788–2790 (1997).
11. D. L. Fried, “Least-squares fitting a wave-front distortion estimate to an array of phase-difference measurements,” J. Opt. Soc. Am. 67, 370–375 (1977).
12. R. L. Frost, C. K. Rushforth, and B. S. Baxter, “Fast-FFTbased algorithm for phase estimation in speckle imaging,” Appl. Opt. 18, 2056–2061 (1979).
13. D. C. Ghiglia and L. A. Romero, “Direct phase estimation from phase differences using elliptic partial differential equation solvers,” Opt. Lett. 14, 1107–1109 (1989).
14. F. Guse, “Auswertung von Messungen mit Optimierungsverfahren demonstriert an Interferometrie und Ellipsometrie,” Ph.D. thesis (Optics Institute, Berlin Technical University, Berlin, 1996).
15. R. H. Hudgin, “Wave-front reconstruction for compensated imaging,” J. Opt. Soc. Am. 67, 375–378 (1977).
16. B. R. Hunt, “Matrix formulation of the reconstruction of phase values from phase differences,” J. Opt. Soc. Am. 69, 393–399 (1979).
17. G. W. R. Leibbrandt, G. Harbers, and P. J. Kunst, “Wavefront analysis with high accuracy by use of a double-grating lateral shearing interferometer,” Appl. Opt. 35, 6151–6161 (1996).
18. S. Loheide and I. Weingärtner, “New procedure for wave front reconstruction,” Optik (Stuttgart) 108, 53–62 (1998).
19. R. J. Noll, “Phase estimates from slope-type wave-front sensors,” J. Opt. Soc. Am. 68, 139–140 (1978).
20. M. P. Rimmer, “Method for evaluating lateral shearing interferograms,” Appl. Opt. 13, 623–629 (1974).
21. M. P. Rimmer and J. C. Wyant, “Evaluation of large aberrations using a lateral-shear interferometer having variable shear,” Appl. Opt. 14, 142–150 (1975).
22. F. Roddier and C. Roddier, “Wavefront reconstruction using iterative Fourier transforms,” Appl. Opt. 30, 1325–1327 (1991).
23. W. H. Southwell, “Wave-front estimation from wave-front slope measurements,” J. Opt. Soc. Am. 70, 998–1006 (1980).
24. H. Takajo and T. Takahashi, “Least-squares phase estimation from the phase difference,” J. Opt. Soc. Am. A 5, 416–425 (1988).
25. X. Tian, M. Itoh, and T. Yatagai, “Simple algorithm for large-grid phase reconstruction of lateral-shearing interferometry,” Appl. Opt. 34, 7213–7220 (1995).