Band offset measurements of ZnO6H-SiC heterostructure system

Applied Physics Letters

Volumn 89, Issue 15, 2006, Pages

  Alivov, Ya I ^a   Xiao, B ^a   Fan, Q ^a   Morko H ^a   Johnstone, D ^b  

^a Virginia Commonwealth University   (United States)

^b SEMETROL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND OFFSET MEASUREMENTS; CONDUCTION BAND; PHOTOCAPACITANCE;

CURRENT VOLTAGE CHARACTERISTICS; DEEP LEVEL TRANSIENT SPECTROSCOPY; SILICON CARBIDE; SPUTTERING; SUBSTRATES;

HETEROJUNCTIONS;

EID: 33750007888     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2360924     Document Type: Article

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