Elucidation of the correlation between atomic-level defects in GaN nanoparticles and photoluminescence properties by NMR, XRD and TEM

Solid State Sciences

Volumn 8, Issue 10, 2006, Pages 1193-1201

  Schwenzer, Birgit ^a   Hu, Jerry ^a   Wu, Yuan ^b   Mishra, Umesh K ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b University of California   (United States)

Author keywords

Atomic level defects; Gallium nitride; Nuclear magnetic resonance; Photoluminescence

Indexed keywords

ATOMIC-LEVEL DEFECTS; CONDUCTION BANDS; ELECTRONIC EFFECTS; NITROGEN-DEFICIENCY;

BAND STRUCTURE; CORRELATION METHODS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; NUCLEAR MAGNETIC RESONANCE; PHOTOLUMINESCENCE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

GALLIUM NITRIDE;

EID: 33749587077     PISSN: 12932558     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solidstatesciences.2006.06.002     Document Type: Article

References (33)

1. Nakamura S., and Fasol G. The Blue Laser Diode (1997), Springer, Berlin pp. 7-12
2. Hirata G.A., Tao J., Chen P., Mishra K.C., and McKittrick J. Mater. Res. Soc. Symp. Proc. 866 (2005) 201
3. Garcia R., Thomas A., Bell A., and Ponce F.A. Mater. Res. Soc. Symp. Proc. 864 (2005) 277
4. Hong G.Y., Jeoung B.W., Han B.Y., and Yoo J.S. J. Electrochem. Soc. 1 (2006) H1
5. Monemar B. J. Cryst. Growth 189/190 (1998) 1
6. Reshchikov M.A., and Morkoç H. J. Appl. Phys. 97 (2005) 061301-1
7. Schwenzer B., Hu J., Seshadri R., Keller S., DenBaars S.P., and Mishra U.K. Chem. Mater. 16 (2004) 5088
8. Yesinowski J.P., Purdy A.P., Wu H., Spencer M.G., Hunting J., and DiSalvo F.J. J. Am. Chem. Soc. 128 (2006) 4952
9. Jung W.-S., Park C., and Han S. Bull. Korean Chem. Soc. 24 (2003) 1011
10. Jung W.-S., Ra C.S., and Min B.-K. Bull. Korean Chem. Soc. 26 (2005) 131
11. Purdy A.P., Jouet R.J., and George C.F. Cryst. Growth Design 2 (2002) 141
12. Bae S.Y., Seo H.W., Park J., Yang H., and Song S.A. Chem. Phys. Lett. 365 (2002) 525
13. Cheng G., Kolmakov A., Zhang Y., Moskovits M., Munden R., Reed M.A., Wang G., Moses D., and Zhang J. Appl. Phys. Lett. 23 (2003) 1578
14. Roos M., Wittrock J., and Meyer G. Z. Anorg. Allg. Chem. 626 (2000) 1179
15. Kam K.C., Deepak F.L., Gundiah G., Rao C.N.R., and Cheetham A.K. Solid State Sci. 6 (2004) 1107
16. Corti M., Gabetta A., Fanciulli M., Svane A., and Christensen N.E. Phys. Rev. B 67 (2003) 064416
17. Purdy A.P., Yesinowski J.P., and Hanbicki A.T. Phys. State Solids C 2 (2005) 2437
18. Hammond G.S. An Introduction to Crystallography and Diffraction (1998), Oxford Univ. Press, Oxford
19. JCPDS 00-050-0792. Balkas C., Basceri C., and Davis R. Powder Diffraction (1995) 266
20. Rietveld refinements made use of version 1.23 of the XND Rietveld code:. Berar J.-F., and Garnier P. NIST Spec. Publ. 846 (1992) 212. http://www.ccp14.ac.uk (freely available from the CCP14 website at http://www.ccp14.ac.uk)
21. Van de Walle C.G. Phys. Rev. B 68 (2003) 165209
22. Loehman R.E., Rao C.N.R., and Honig J.M. J. Phys. Chem. 73 (1969) 1781
23. Stringer J. J. Less-Common Met. 8 (1965) 1
24. Gonsalves K.E., Rangarajan S.P., Carlson G., Kumar J., Yang K., Benaissa M., and José-Yacaman M. Appl. Phys. Lett. 71 (1997) 2175
25. Sardar K., and Rao C.N.R. Adv. Mater. 16 (2004) 425
26. Coffer J.F., Johnson M.A., and Zhang L. Chem. Mater. 9 (1997) 2671
27. Ogino T., and Aoki M. Jpn. J. Appl. Phys. 19 (1980) 2395
28. Kucheyev S.O., Toth M., Phillips M.R., Williams J.S., and Jagadish C. J. Appl. Phys. 91 (2002) 5867
29. Neugebauer J., and Van de Walle C.G. Appl. Phys. Lett. 69 (1996) 503
30. Reynolds D.C., Look D.C., Jogai B., Van Nostrand J.E., Jones R., and Jenny J. Solid State Commun. 106 (1998) 701
31. Bradley S.M., Howe R.F., and Kydd R.A. Magn. Reson. Chem. 31 (1993) 883
32. Han O.H., Timken H.K.C., and Oldfield E. J. Chem. Phys. 89 (1988) 6046
33. Geisz J.F., Reedy R.C., Keyes B.M., and Metzger W.K. J. Cryst. Growth 259 (2003) 223