Orientated nano grain growth and effect of annealing on grain size in LiTaO3 thin films deposited by sol-gel technique

Journal of Crystal Growth

Volumn 291, Issue 1, 2006, Pages 232-238

  Satapathy, S ^a   Varma, K B R ^b  

^a RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

^b INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

A1. Atomic force microscopy (AFM); A1. Nano structures; A1. X ray diffraction; A3. Polycrystalline deposition; B2. Ferroelectric materials

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTAL LATTICES; CRYSTAL ORIENTATION; FERROELECTRIC MATERIALS; GRAIN GROWTH; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; SOL-GELS; THIN FILMS; X RAY DIFFRACTION;

CRYSTALLINITY; LITAO3; POLYCRYSTALLINE DEPOSITION; TIO2;

LITHIUM COMPOUNDS;

EID: 33749409804     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.02.034     Document Type: Article

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